Page 4 - Pin Configurations
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 4 of 29 Pin Configurations A A A A A 1 A 0 V SS V DD A A A A A A V DDQ V SS DQb DQb DQb V SS V DDQ DQb DQb V SS NC V DD DQaDQa V DDQ V SS DQaDQa V SS V DDQ V DDQ V SS DQc DQc V SS V DDQ DQc V DD V SS DQd DQd V DDQ V SS DQdDQd...
Page 5 - TMS
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 5 of 29 Pin Configurations (continued) 165-Ball FBGA (15 x 17 x 1.4 mm) Pinout CY7C1470BV25 (2M x 36) CY7C1472BV25 (4M x 18) 2 3 4 5 6 7 1 A B CD E F G H J K L M N P R TDO NC/576M NC/1G DQP c DQ c DQP d NC DQ d A CE 1 BW b CE...
Page 8 - Functional Overview; Single Read Accesses; Single Read; Single Write Accesses
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 8 of 29 Functional Overview The CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25are synchronous-pipelined Burst NoBL SRAMs designed specif-ically to eliminate wait states during read or write transitions. Allsynchronous inputs pa...
Page 9 - Sleep Mode; ZZ Mode Electrical Characteristics
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 9 of 29 access (read, write, or deselect) is latched into the AddressRegister (provided the appropriate control signals are asserted). On the next clock rise the data presented to DQ and DQP (DQ a,b,c,d /DQP a,b,c,d for CY7C1...
Page 12 - Disabling the JTAG Feature; through a pull up resistor. TDO must be left; Performing a TAP Reset; A RESET is performed by forcing TMS HIGH (V; TAP Registers; Figure 2. TAP Controller State Diagram; Figure 3. TAP Controller Block Diagram
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 12 of 29 IEEE 1149.1 Serial Boundary Scan (JTAG) The CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25incorporates a serial boundary scan test access port (TAP). Thisport operates in accordance with IEEE Standard 1149.1-1990but do...
Page 13 - “TAP Controller Block Diagram”; Boundary Scan Order tables on page 17; TAP Instruction Set; “Identification
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 13 of 29 Instruction Register Three-bit instructions can be serially loaded into the instructionregister. This register is loaded when it is placed between the TDIand TDO balls as shown in the “TAP Controller Block Diagram” o...
Page 14 - Figure 4. TAP Timing; T e st Clo ck
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 14 of 29 possible to capture all other signals and simply ignore the valueof the CLK captured in the boundary scan register. After the data is captured, it is possible to shift out the data byputting the TAP into the Shift-DR...
Page 15 - TAP AC Switching Characteristics
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 15 of 29 TAP AC Switching Characteristics Over the Operating Range [9, 10] Parameter Description Min Max Unit Clock t TCYC TCK Clock Cycle Time 50 ns t TF TCK Clock Frequency 20 MHz t TH TCK Clock HIGH time 20 ns t TL TCK Clo...
Page 16 - V TAP AC Test Conditions; T D O; TAP DC Electrical Characteristics And Operating Conditions
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 16 of 29 2.5V TAP AC Test Conditions Input pulse levels ................................................. V SS to 2.5V Input rise and fall time ..................................................... 1 ns Input timing reference...
Page 19 - Electrical Characteristics
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 19 of 29 Maximum Ratings Exceeding maximum ratings may impair the useful life of thedevice. These user guidelines are not tested. Storage Temperature ................................. –65°C to +150°C Ambient Temperature withP...
Page 21 - Switching Characteristics; “AC Test Loads and
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 21 of 29 Switching Characteristics Over the Operating Range. Timing reference is 1.25V when V DDQ = 2.5V. Test conditions shown in (a) of “AC Test Loads and Waveforms” on page 20 unless otherwise noted. Parameter Description ...
Page 22 - Switching Waveforms; Figure 6
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 22 of 29 Switching Waveforms Figure 6 shows read-write timing waveform. [19, 20, 21] Figure 6. Read/Write Timing WRITE D(A1) 1 2 3 4 5 6 7 8 9 CLK t CYC t CL t CH 10 CE t CEH t CES WE CEN t CENH t CENS BW x ADV/LD t AH t AS A...
Page 23 - Figure 7. NOP, STALL and DESELECT Cycles; Figure 8; Mode Timing
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 23 of 29 Figure 7 shows NOP, STALL and DESELECT Cycles waveform. [19, 20, 22] Figure 7. NOP, STALL and DESELECT Cycles Figure 8 shows ZZ Mode timing waveform. [23, 24] Figure 8. ZZ Mode Timing Switching Waveforms (continued) ...
Page 24 - Ordering Information; for actual products offered.
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 24 of 29 Ordering Information Not all of the speed, package and temperature ranges are available. Please contact your local sales representative or visit www.cypress.com for actual products offered. Speed (MHz) Ordering Code ...
Page 26 - Package Diagrams
CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document #: 001-15032 Rev. *D Page 26 of 29 Package Diagrams Figure 9. 100-Pin Thin Plastic Quad Flatpack (14 x 20 x 1.4 mm), 51-85050 NOTE: 1. JEDEC STD REF MS-026 2. BODY LENGTH DIMENSION DOES NOT INCLUDE MOLD PROTRUSION/END FLASH MOLD PROTRUSION/END FLASH S...
Page 29 - Document History Page; Description of Change
Document #: 001-15032 Rev. *D Revised February 29, 2008 Page 29 of 29 NoBL and No Bus Latency are trademarks of Cypress Semiconductor Corporation. ZBT is a trademark of Integrated Device Technology, Inc. All products and company names mentioned in thisdocument may be the trademarks of their respecti...