Cypress CY62146EV30 - Manual
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Table of Contents:
- Page 2 – ROW DECODER; OE; Top View
- Page 3 – Electrical Characteristics; Full device AC operation assumes a minimum of 100
- Page 4 – DATA RETENTION MODE; CE; Full device operation requires linear V; ramp from V; to V
- Page 5 – Switching Characteristics; “AC Test Loads and Waveforms” on page 4
- Page 6 – Switching Waveforms; Read Cycle 1; PREVIOUS DATA VALID; RC; ADDRESS
- Page 7 – SA; If CE goes HIGH simultaneously with WE = V; , the output remains in a high impedance state.
- Page 10 – Package Diagrams
- Page 12 – Document History Page; Change
CY62146EV30 MoBL
®
4-Mbit (256K x 16) Static RAM
Cypress Semiconductor Corporation
•
198 Champion Court
•
San Jose
,
CA 95134-1709
•
408-943-2600
Document #: 38-05567 Rev. *C
Revised March 26, 2007
Features
• Very high speed: 45 ns
• Wide voltage range: 2.20V–3.60V
• Pin compatible with CY62146DV30
• Ultra low standby power
— Typical standby current: 1
µ
A
— Maximum standby current: 7
µ
A
• Ultra low active power
— Typical active current: 2 mA @ f = 1 MHz
• Easy memory expansion with CE, and OE features
• Automatic power down when deselected
• CMOS for optimum speed and power
• Available in a Pb-free 48-ball VFBGA and 44-pin TSOP II
packages
Functional Description
The CY62146EV30 is a high performance CMOS static RAM
organized as 256K words by 16 bits. This device features
advanced circuit design to provide ultra low active current.
This is ideal for providing More Battery Life™ (MoBL
®
) in
portable applications such as cellular telephones. The device
also has an automatic power down feature that significantly
reduces power consumption by 80% when addresses are not
toggling. The device can also be put into standby mode
reducing power consumption by more than 99% when
deselected (CE HIGH). The input and output pins (IO
0
through
IO
15
) are placed in a high impedance state when:
• Deselected (CE HIGH)
• Outputs are disabled (OE HIGH)
• Both Byte High Enable and Byte Low Enable are disabled
(BHE, BLE HIGH)
• Write operation is active (CE LOW and WE LOW)
Write to the device by taking Chip Enable (CE) and Write
Enable (WE) inputs LOW. If Byte Low Enable (BLE) is LOW,
then data from IO pins (IO
0
through IO
7
), is written into the
location specified on the address pins (A
0
through A
17
). If Byte
High Enable (BHE) is LOW, then data from IO pins (IO
8
through IO
15
) is written into the location specified on the
address pins (A
0
through A
17
).
Read from the device by taking Chip Enable (CE) and Output
Enable (OE) LOW while forcing the Write Enable (WE) HIGH.
If Byte Low Enable (BLE) is LOW, then data from the memory
location specified by the address pins appear on IO
0
to IO
7
. If
Byte High Enable (BHE) is LOW, then data from memory
appears on IO
8
to IO
15
for a
complete description of read and write modes.
Product Portfolio
Product
V
CC
Range (V)
Speed
(ns)
Power Dissipation
Operating I
CC
(mA)
Standby I
SB2
(
µ
A)
f = 1 MHz
f = f
max
Min
Typ
[2]
Max
Typ
[2]
Max
Typ
Max
Typ
Max
CY62146EV30LL
2.2
3.0
3.6
45 ns
2
2.5
15
20
1
7
Notes:
1. For best practice recommendations, please refer to the Cypress application note
System Design Guidelines
on
http://www.cypress.com
.
2. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V
CC
= V
CC(typ)
, T
A
= 25°C.
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Summary
CY62146EV30 MoBL ® Document #: 38-05567 Rev. *C Page 2 of 12 Logic Block Diagram Pin Configurations [3, 4] 256K x 16 RAM Array IO 0 –IO 7 ROW DECODER A 8 A 7 A 6 A 5 A 2 COLUMN DECODER A 11 A 12 A 13 A 14 A 15 SENSE AMPS DATA IN DRIVERS OE A 4 A 3 IO 8 –IO 15 CE WE BHE A 16 A 0 A 1 A 9 A 10 BLE A 17...
CY62146EV30 MoBL ® Document #: 38-05567 Rev. *C Page 3 of 12 Maximum Ratings Exceeding the maximum ratings may impair the useful life of the device. These user guidelines are not tested.Storage Temperature ................................ –65°C to + 150°CAmbient Temperature with Power Applied .........
CY62146EV30 MoBL ® Document #: 38-05567 Rev. *C Page 4 of 12 Capacitance (For All Packages) [9] Parameter Description Test Conditions Max Unit C IN Input Capacitance T A = 25°C, f = 1 MHz, V CC = V CC(typ) 10 pF C OUT Output Capacitance 10 pF Thermal Resistance [9] Parameter Description Test Conditi...
