National Instruments DAQ S - Manual

National Instruments DAQ S

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Table of Contents:

  • Page 3 – Important Information; Warranty; Patents; WARNING REGARDING USE OF NATIONAL INSTRUMENTS PRODUCTS
  • Page 4 – Compliance; Determining FCC Class; Class A; Federal Communications Commission; Compliance with EU Directives
  • Page 5 – Contents; About This Manual
  • Page 10 – Glossary
  • Page 11 – Conventions; File»Page Setup»Options; bold
  • Page 12 – Related Documentation; LabVIEW
  • Page 13 – Measurement Studio
  • Page 14 – ANSI C without NI Application Software; .NET Languages without NI Application Software
  • Page 15 – Device Documentation and Specifications
  • Page 16 – Getting Started; Installing Other Software
  • Page 17 – Installing the Hardware; Device Self-Calibration; My System»Devices and Interfaces»NI-DAQmx
  • Page 18 – Device Pinouts; Device Specifications
  • Page 19 – DAQ System Overview
  • Page 20 – DAQ Hardware
  • Page 22 – Calibration Circuitry; Internal or Self-Calibration
  • Page 23 – External Calibration; Manual Calibration Procedures; Signal Conditioning; Help»Search the LabVIEW Help
  • Page 24 – Programming Devices in Software; Help»Find Examples
  • Page 25 – NI 6124 I/O Connector Signal Descriptions
  • Page 28 – Analog Input
  • Page 29 – Analog Input Terminal Configuration
  • Page 30 – Input Polarity and Range
  • Page 31 – Working Voltage Range; AI Data Acquisition Methods; Software-Timed Acquisitions
  • Page 33 – Analog Input Triggering; Connecting Analog Input Signals; Input
  • Page 34 – Types of Signal Sources; Floating Signal Sources; Ground-Referenced Signal Sources; Differential Connections for Ground-Referenced Signal Sources
  • Page 36 – Common-Mode Signal Rejection Considerations
  • Page 37 – Low Source Impedance
  • Page 38 – High Source Impedance; Field Wiring Considerations
  • Page 39 – Minimizing Drift in Differential Mode
  • Page 40 – Analog Input Timing Signals
  • Page 41 – AI Sample Clock Signal
  • Page 42 – Using an External Source; Other Timing Requirements
  • Page 43 – AI Sample Clock Timebase Signal; AI Convert Clock Signal
  • Page 44 – Using an Internal Source
  • Page 45 – AI Hold Complete Event Signal
  • Page 46 – Using an Analog Source; AI Reference Trigger Signal
  • Page 47 – Using a Digital Source
  • Page 48 – Getting Started with AI Applications in Software
  • Page 49 – Analog Output
  • Page 50 – AO FIFO; AO Sample Clock; Isolation Barrier and Digital Isolators; DAC; Minimizing Glitches on the Output Signal; AO Data Generation Methods; Software-Timed Generations
  • Page 51 – Hardware-Timed Generations
  • Page 52 – Analog Output Triggering; Connecting Analog Output Signals
  • Page 54 – Waveform Generation Timing Signals; AO Sample Clock Signal
  • Page 56 – AO Sample Clock Timebase Signal
  • Page 57 – AO Start Trigger Signal
  • Page 58 – AO Pause Trigger Signal
  • Page 59 – Getting Started with AO Applications in Software
  • Page 61 – Static DIO for Non-Isolated Devices
  • Page 62 – Digital Waveform Triggering for Non-Isolated Devices; Digital Waveform Acquisition for Non-Isolated Devices
  • Page 63 – DI Sample Clock Signal
  • Page 64 – Routing DI Sample Clock to an Output Terminal; Digital Waveform Generation for Non-Isolated Devices; DO Sample Clock Signal
  • Page 66 – Programmable Power-Up States for Non-Isolated Devices
  • Page 67 – DI Change Detection for Non-Isolated Devices
  • Page 68 – Connecting Digital I/O Signals on Non-Isolated Devices
  • Page 70 – Static DIO for Isolated Devices
  • Page 71 – I/O Protection for Isolated Devices; Connecting Digital I/O Signals on Isolated Devices
  • Page 73 – Counters
  • Page 74 – Counter Input Applications; Counting Edges
  • Page 76 – Controlling the Direction of Counting; Pulse-Width Measurement
  • Page 78 – Period Measurement
  • Page 79 – Semi-Period Measurement
  • Page 80 – Single Semi-Period Measurement
  • Page 81 – Frequency Measurement; Method 1: Measure Low Frequency with One Counter
  • Page 82 – Method 2: Measure High Frequency with Two Counters
  • Page 84 – Choosing a Method for Measuring Frequency
  • Page 85 – Task
  • Page 86 – Position Measurement
  • Page 87 – X4 Encoding; Channel Z Behavior
  • Page 89 – Buffered (Sample Clock) Position Measurement
  • Page 90 – Buffered Two-Signal Edge-Separation Measurement
  • Page 91 – Counter Output Applications; Simple Pulse Generation
  • Page 92 – Retriggerable Single Pulse Generation
  • Page 93 – Pulse Train Generation
  • Page 94 – Finite Pulse Train Generation
  • Page 95 – Frequency Generation
  • Page 96 – Frequency Division; Pulse Generation for ETS
  • Page 97 – Counter Timing Signals
  • Page 98 – Counter; Application
  • Page 102 – Routing Counter; Default Counter/Timer Pinouts
  • Page 103 – Counter Triggering; Arm Start Trigger
  • Page 104 – Other Counter Features; Cascading Counters; Counter Filters
  • Page 105 – Prescaling
  • Page 108 – Example Application That Prevents Duplicate Count
  • Page 109 – When To Use Duplicate Count Prevention; Enabling Duplicate Count Prevention in NI-DAQmx; Enable Duplicate Count Prevention
  • Page 111 – External Source Mode
  • Page 112 – PFI for Non-Isolated Devices
  • Page 113 – PFI for Isolated Devices
  • Page 115 – Using PFI Terminals as Timing Input Signals; Exporting Timing Output Signals Using PFI Terminals
  • Page 116 – Using PFI Terminals as Static Digital Inputs and Outputs
  • Page 117 – Connecting PFI Input Signals; PFI Filters
  • Page 119 – Programmable Power-Up States
  • Page 121 – Clock Routing
  • Page 122 – 0 MHz Timebase
  • Page 123 – 0 MHz Reference Clock; Synchronizing Multiple Devices
  • Page 124 – RTSI Connector Pinout; Terminal
  • Page 125 – Using RTSI as Outputs
  • Page 126 – Using RTSI Terminals as Timing Input Signals
  • Page 128 – PXI Clock and Trigger Signals; PXI Triggers
  • Page 130 – Routing Signals in Software; Language
  • Page 131 – Bus Interface; PXI Considerations; PXI Express
  • Page 132 – Data Transfer Methods; Changing Data Transfer Methods between DMA and IRQ; Data Transfer Mechanism
  • Page 133 – Triggering; Triggering with a Digital Source
  • Page 135 – Analog Input Channel; Analog Trigger Actions; Analog Trigger Types; Analog Edge Triggering
  • Page 136 – Analog Edge Triggering with Hysteresis
  • Page 138 – Analog Window Triggering
  • Page 140 – NI 6124 I/O Connector Pinout
  • Page 142 – NI 6124 Cables and Accessories
  • Page 143 – Using BNCs
  • Page 146 – NI 6154 I/O Connector Pinout; Port
  • Page 148 – NI 6154 Cables and Accessories
  • Page 149 – NI 6154 Isolation and Digital Isolators; Ground
  • Page 150 – Digital Isolation; Benefits of an Isolated DAQ Device; Improved rejection
  • Page 151 – Improved accuracy; Improved safety
  • Page 153 – Calibration Certificate
  • Page 154 – Symbol; Symbols
  • Page 165 – Index; Numerics
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DAQ S Series

NI 6124/6154 User Manual

DAQ-STC2 S Series Simultaneous Sampling Multifunction Input/Output Devices

NI 6124/6154 User Manual

August 2008
372613A-01

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Summary

Page 3 - Important Information; Warranty; Patents; WARNING REGARDING USE OF NATIONAL INSTRUMENTS PRODUCTS

Important Information Warranty NI 6124 and NI 6154 devices are warranted against defects in materials and workmanship for a period of one year from the date of shipment, as evidenced by receipts or other documentation. National Instruments will, at its option, repair or replace equipment that proves...

Page 4 - Compliance; Determining FCC Class; Class A; Federal Communications Commission; Compliance with EU Directives

Compliance Compliance with FCC/Canada Radio Frequency Interference Regulations Determining FCC Class The Federal Communications Commission (FCC) has rules to protect wireless communications from interference. The FCC places digital electronics into two classes. These classes are known as Class A (fo...

Page 5 - Contents; About This Manual

© National Instruments Corporation v NI 6124/6154 User Manual Contents About This Manual Conventions ................................................................................................................... xiRelated Documentation...............................................................

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