Page 2 - not be liable for errors contained herein or for incidental or
Notice. The information contained in this document is subject to change without notice.Hewlett-Packard makes no warranty of any kind with regard to this material, including but not limited to, the implied warranties of merchantability and fitness for a particular purpose. Hewlett-Packard not be liab...
Page 3 - Certification; Note; RE
Certification Hewlett-Packard Company certifies that this product met its published specifications at the time of shipment from the factory. Hewlett-Packard further certifies that its calibration measurements are traceable to the United States National Institute of Standards and to the extent allowe...
Page 4 - Maintenance; Clean the cabinet, using a damp cloth only.; Assistance; for; Shipment for Service
Maintenance Clean the cabinet, using a damp cloth only. Assistance for Shipment for Service If you are sending the instrument to Hewlett-Packard for service, ship the analyzer to the nearest HP service center for repair, including a description of any failed test and any error message. Ship the anal...
Page 5 - Service
Hewlett-Packard Service UNITED STATES Instrument Support Center Hewlett-Packard Company (800) 403-0801 EUROPEAN Headquarters Hewlett-Packard S.A. Hewlett-Packard France Hewlett-Packard 150, Route du 1 Avenue Du Canada Hewlett-Packard 1217 Meyrin Zone De 61352 Bad Homburg v.d.H Les Cedex (41 22) 780....
Page 6 - Safety Symbols; The following safety symbols are used throughout this manual.; Caution; conditions are fully understood and met.; Warning; denotes a hazard. It calls attention to a procedure which, if not; Instrument Markings
Safety Symbols The following safety symbols are used throughout this manual. yourself with each of the symbols and its meaning before operating this instrument. Caution Caution denotes a hazard. It calls attention to a procedure that, if not correctly performed or adhered to, would result in damage ...
Page 7 - General Safety Considerations; installed. Assure the supply voltage is in the specified range.
General Safety Considerations Note This instrument has been designed and tested in accordance with IEC Publication 1010, Safety Requirements for Electronics Measuring Apparatus, and has been supplied in a safe condition. This instruction documentation contains information and warnings which must be ...
Page 8 - protects agaius; Compliance with German FTZ Emissions Requirements; Acoustic Noise
Caution This product is designed for use in Installation Category II and Pollution Degree 2 per IEC 1010 and 664 respectively. Caution VENTILATION REQUIREMENTS: When the product in a cabinet, the convection into and out of the product must not be restricted. The ambient temperature (outside the cabi...
Page 9 - User’s Guide Overview
User’s Guide Overview n Chapter 1, “HP 8753E Description and Options, describes features, functions, and available options. n Chapter 2, “Making Measurements,” contains step-by-step procedures for making measurements or using particular functions. n Chapter 3, “Making Mixer Measurements, contains st...
Page 10 - Network Analyzer Documentation Set
Network Analyzer Documentation Set The Installation and Quick Guide familiarizes you with the network analyzer’s front and rear panels, electrical and environmental operating requirements, as well as procedures for installing, configuring, and verifying the operation of the analyzer. The User’s Guid...
Page 13 - HP 8753E Description and Options; Option; Measurements
1. HP 8753E Description and Options Where to Look for More Information . . . . . . . . . . . . . . . . . . . . . Analyzer Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Front Panel Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Analyzer Display . . . . . . ...
Page 15 - Making Mixer Measurements
3. Set Up the Lower Parameters . . . . . . . . . . . . . . . . . . 2-63 Set Up the Parameters . . . . . . . . . . . . . . . . . . . . . 2-63 Set Up the Upper Parameters . . . . . . . . . . . . . . . . . . 2-63 Calibrate and Measure . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-64 Measureme...
Page 16 - Measurement Results
LO to RF Isolation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-33 RF Feedthrough . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-35 4. Printing, Plotting, and Measurement Results Where to Look for More Information . . . . . . . . . . . . . . . . . . . . . 4 - 2 Printing...
Page 17 - Solving Problems with Saving or Recalling; Optimizing Measurement; Results
What You Can Save to a Computer . . . . . . . . . . . . . . . . . . . . . Saving an Instrument State . . . . . . . . . . . . . . . . . . . . . . . . . . Saving Measurement Results . . . . . . . . . . . . . . . . . . . . . . . . . ASCII Data Formats . . . . . . . . . . . . . . . . . . . . . . . . . ....
Page 18 - Application and Operation Concepts; The
Deleting Frequency Segments . . . . . . . . . . . . . . . . . . . . . . 5-36 Compensating for Directional Coupler Response . . . . . . . . . . . . . . . 5-36 Using Sample-and-Sweep Correction Mode . . . . . . . . . . . . . . . . . . 5-37 Using Continuous Correction Mode . . . . . . . . . . . . . . ....
Page 25 - LO Frequency Accuracy and; Specifications and Measurement Uncertainties; Rear
7 . LO Frequency Accuracy and . . . . . . . . . . . . . . . . . . . 6-161 Up-Conversion and Down-Conversion Definition . . . . . . . . . . . . . . 6-161 Conversion Loss . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-164 Isolation . . . . . . . . . . . . . . . . . . . . . . . . . . . ....
Page 26 - Compatible Peripherals
Environmental Characteristics . . . . . . . . . . . . . . . . . . . . . . . 7-20 General Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-20 Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-20 Non-Operating Storage Conditions . . . . . . . . . . . . . ...
Page 27 - Code; Preset State and Memory Allocation
If the Peripheral Is a Plotter . . . . . . . . . . . . . . . . . . . . . . . . 11-10 Compatible Printer (used as a plotter) . . . . . . . . . . . . . . . 11-10 Pen Plotter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11-12 If the Peripheral Is a Power Meter . . . . . . . . . . . . ....
Page 28 - B. Determining System Measurement Uncertainties; Characteristic; Index
Example List Set . . . . . . . . . . . . Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . The Keyword Reference . . . . . . . . . . . . . . . . . . . . . . . B. Determining System Measurement Uncertainties Sources of Measurement Errors . . . . . . . . . . . . . . . . . . . ...
Page 29 - Analyzer Display; on; -13. Example of a Fixed Reference Marker Using
l-l. HP 8753E Front Panel . . . . . . . . . . . . . . . . . . . . . . . . . . . Analyzer Display Channel, Cartesian Format) . . . . . . . . . . . . . HP 8753E Rear Panel . . . . . . . . . . . . . . . . . . . . . . . . . . . Basic Measurement Setup . . . . . . . . . . . . . . . . . . . . . . . . . 2-...
Page 31 - Data Processing
4-2. Printing Two Measurements . . . . . . . . . . . . . . . . . . . . . . . . 4-3. Peripheral Connections to the Analyzer . . . . . . . . . . . . . . . . . . . 4-4. Plot Components Available through Definition . . . . . . . . . . . . . . . . 4-5. Line Types Available . . . . . . . . . . . . . . . ....
Page 35 - Keyboard Template
9-2. Locations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Keyboard Template . . . . . . . . . . . . . . . . . . . . . . . 11-2. Code Naming Convention . . . . . . . . . . . . . . . . . . . . . . . . . 12-1. Memory Requirements of Calibration and Memory Trace Arrays . . . . . . . 12-2....
Page 36 - Where to Look for More Information; HP
This chapter contains information on the following topics: n Analyzer overview n Analyzer description n panel features Analyzer display Rear panel features and connectors n Analyzer options available n Service and support options Differences among the HP 8753 network analyzers Where to Look for More...
Page 37 - Analyzer Description; Control
Analyzer Description The HP 8753E is a high performance vector network analyzer for laboratory or production measurements of reflection and transmission parameters. It integrates a high resolution synthesized RF source, an S-parameter test set, and a four-channel three-input receiver to measure and ...
Page 39 - Front Panel Features; RESPONSE function block. The
Front Panel Features Caution Do not mistake the line switch for the disk eject button. See the figure below. If the line switch is mistakenly pushed, the instrument will be turned off, losing all settings and data that have not been saved. Figure l-l. 8753E Front Panel F’igure l-l shows the location...
Page 41 - connector; CHANNEL; connectors
10. 11. 12. 13. 14. The block. This block includes the knob, the step keys, the number pad, and the backspace key. These allow you to enter numerical data and control the markers. You can use the numeric keypad to select digits, decimal points, and a minus sign for numerical entries. You must also s...
Page 42 - Stimulus Start Value. This
Analyzer Display DATA DISPLAY AREA 2 Figure 1-2. Analyzer Display (Single Channel, Cartesian Format) The analyzer display shows various measurement information: n The grid where the analyzer plots the measurement data. n The currently selected measurement parameters. n The measurement data traces. F...
Page 43 - Description and Options
2. Stimulus Stop Value. This value could be any one of the following: n The stop frequency of the source in frequency domain measurements. n The stop time in time domain measurements or CW sweeps. The upper limit of a power sweep. When the stimulus is in center/span mode, is shown in this space. The...
Page 44 - Smo; Active
Hld PC PC? Smo Harmonic mode is on, and the second harmonic is being measured (harmonics Option 002 only). (See “Analyzer Options Available” later in this chapter.)Harmonic mode is on, and the third harmonic is being measured (harmonics Option 002 only). (See “Analyzer Options Available” later in th...
Page 46 - Panel Features and Connectors; Panel
Panel Features and Connectors Figure 1-3. HP 8753E Panel Figure illustrates the features and connectors of the rear panel, described below. Requirements for input signals to the rear panel connectors are provided in Chapter 7, “Specifications and Measurement 1. 2. 3. 4. 5. 6. 7.8.9. connector. This ...
Page 48 - Analyzer Options Available
Analyzer Options Available Option High Stability Frequency Reference Option offers ppm temperature stability from 0 to 60 (referenced to 25 Option 002, Harmonic Mode Provides measurement of second or third harmonics of the test device’s fundamental output signal. Frequency and power sweep are suppor...
Page 49 - Service and Support Options
Option Rack Mount Flange Kit With Handles Option is a rack mount kit containing a pair of flanges and the necessary hardware to mount the instrument with handles attached in an equipment rack with 482.6 mm (19 inches) spacing. Service and Support Options Hewlett-Packards offers many repair and calib...
Page 50 - Differences among the HP 8753 Network Analyzers
Differences among the HP 8753 Network Analyzers l-l. Comparing the Opt 011 N o N oN o Yes Feature Fully integrated measurement system (built-in test No N o N o port power Auto/manual power selecting Port power No No Internal disk drive No N o Precision frequency reference (Option No N o Frequency ra...
Page 52 - Making Measurements
This Chapter contains the following example procedures for making measurements or using particular functions: n Basic measurement sequence and example Setting frequency range Setting source power Analyzer display functions n Four-Parameter Display Mode Analyzer marker functions n Magnitude and inser...
Page 53 - Principles of Microwave Connector Care; cleaning and gaging connectors.; Connector Care Quick Reference
Principles of Microwave Connector Care Proper connector care and connection techniques are critical for accurate, repeatable measurements. Refer to the calibration kit documentation for connector care information. Prior to making connections to the network analyzer, carefully review the information ...
Page 54 - Basic Measurement Sequence and Example; Basic Measurement Sequence; There are five basic steps when you are making a measurement.; Measure the device under test.; Basic Measurement Example; Make the connections as shown in Figure; Step 2. Choose the measurement parameters.; To set preset to “Factory Preset, press:; Setting the Frequency Range.; Measurements 23
Basic Measurement Sequence and Example Basic Measurement Sequence There are five basic steps when you are making a measurement. 1. Connect the device under test and any required test equipment. Caution Damage may result to the device under test if it is sensitive to the analyzer’s default output pow...
Page 55 - Setting the Source Power.; one; Setting the Measurement.; and apply the appropriate error-correction.; 4 Making Measurements
4. set the span to 30 MHz, press: Note You could also press the and keys and enter the frequency range limits as start frequency and stop frequency values Setting the Source Power. 5. change the power level to -5 press: Note You could also press and select one of the power ranges to keep the power s...
Page 56 - If the Iine switch is mistakenly pushed, the instrument; Step
Caution Do not mistake the Iine switch for the disk eject button. See the figure below. If the Iine switch is mistakenly pushed, the instrument be turned off, losing settings and data that have not been saved. Step 4. Measure the device under test. 11. Replace any standard used for error-correction ...
Page 57 - Using the Display Functions; View Both Primary Measurement Channels; view the measurements on separate graticules, press: Set; Channel With Split Display On
Using the Display Functions View Both Primary Measurement Channels In some cases, you may want to view more than one measured parameter at a time. Simultaneous gain and phase measurements for example, are useful in evaluating stability in negative feedback amplifiers. You can easily make such measur...
Page 58 - Press; View the Measurement Data and Memory Trace
3. To return to a single-graticule display, press: . . . . . . . . . . . . . . . . . . . . . . . . . . . . Note You can control the stimulus functions of the two channels independent of each Save a Data Trace to the Display Memory Press to store the current active measurement data in the memory of t...
Page 60 - Title the Active Channel Display
Title the Active Channel Display . q If you have a DIN keyboard attached to the analyzer, type the title you want from the keyboard. Then press to enter the title into the analyzer. You can enter a title that has a maximum of 50 characters. (For more information on using a keyboard with the analyzer...
Page 62 - Display; Making Measurements 2-11
The display will appear as shown in 2-5. Channel 1 is in the upper left quadrant of the display, channel 2 is in the upper right quadrant, and channel 3 is in the lower half of the display. L O G . 5 R E F - 2 1 7 S s p 1 9 9 8 L O G 1 0 R E F C E N T R 1 3 4 . 0 0 0 M H z 4 5 . 0 0 0 M H z S T A R ...
Page 63 - Activate and; Making Measurements
This enables channel 4 and the screen now displays four separate grids as shown in 2-6. Channel 4 is in the lower-right quadrant of the screen. 2 S e p 1 9 9 8 5 7 LOG . 5 REF - 2 L O G 1 0 R E F - 5 0 C E N T R 1 3 4 . 0 0 0 4 5 . 0 0 0 M H z L O G 1 0 R E F - 5 0 I I I I I I I I C E N T R 1 3 4 . ...
Page 64 - Quick Four-Parameter Display; Characterizing a Duplexer; Transmit; Making
13. Press again. Observe that the LED is flashing, indicating that channel 3 is active. 14. Rotate the front panel control knob and notice that marker 2 still moves on all four channel traces. 15. To independently control the channel markers: Press (Marker) set to UNCOUPLED. . .. .../ . . . . . .......
Page 68 - Using Analyzer Display Markers; Use Continuous and Discrete Markers
Using Analyzer Display Markers The analyzer markers provide numerical readout of trace data. You can control the marker search, the statistical functions, and the capability for quickly changing stimulus parameters with markers, from the key. Markers have a stimulus value (the x-axis value in a Cart...
Page 69 - Activate Display Markers; switch on marker 1 and make it the active marker, press:; Example
Activate Display Markers switch on marker 1 and make it the active marker, press: The active marker appears on the analyzer display as V. The active marker stimulus value is displayed in the active entry area. You can modify the stimulus value of the active marker, using the front panel knob or nume...
Page 70 - t i i; Figure 2-10. Marker Information Moved into the
Move Marker Information off of the Grids If marker information obscures the display traces, you can turn off the menu and move the marker information off of the display traces and into the menu area. Pressing the backspace key performs this function. This is a toggle function of the backspace key. T...
Page 71 - Information on the Graticules
4. Restore the menu and move the marker information back onto the graticules: Press The display will be similar to Figure 2-11. L O G 5 R E F - 2 1 5 1 . 5 0 9 M H z ‘ - 3 . 1 5 8 5 MHz C E N T R 1 3 4 . 0 0 0 M H z S P A N 4 5 . 0 0 0 M H z LOG 151.509 REF -50 500 MHz M a r k e r s - - MHZ I I I I ...
Page 72 - as the Reference Marker Example; Activate a Fixed Marker; When a reference marker is
and move marker 2 to any position that you want to measure in reference Figure 2-12. 1 as the Reference Marker Example 4. change the reference marker to marker 2, press: Activate a Fixed Marker When a reference marker is it does not rely on a current trace to maintain its fixed position. The analyze...
Page 75 - Couple and Uncouple Display Markers; Figure 2-15. Example of Coupled and Uncoupled Markers; Use Polar Format Markers
Couple and Uncouple Display Markers At a preset state, the markers have the same values on each channel, but they can be uncoupled so that each channel has independent markers. . . . . . : for the display channels. Choose if you want the analyzer to uncouple the marker stimulus . . . . . . . . ..<...
Page 76 - Use Smith Chart Markers
2. Select the type of polar marker you want from the following choices: n Choose if you want to view the magnitude and the phase of the active marker. The magnitude values appear in and the phase values appear in degrees. active marker. The magnitude values appear in and the phase values appear in d...
Page 77 - Figure 2-17. Example of Impedance Smith Chart Markers; Set Measurement Parameters Using Markers
The marker annotation tells that the complex impedance is capacitive in the bottom half of the Smith chart display and is inductive in the top half of the display. n Choose if you want the analyzer to show the linear magnitude and the phase of the reflection coefficient at the marker. n Choose if yo...
Page 78 - Setting the Start Frequency; and turn the front panel knob, or enter a value from the front panel; Setting the Stop Frequency; the; Frequency Using a Marker; the Stop Frequency Using a; Making Measurements 2-27
Setting the Start Frequency 1. and turn the front panel knob, or enter a value from the front panel keypad to position the marker at the value that you want for the start frequency. the value of the marker. Figure 2-18. Example of Setting Setting the Stop Frequency 1. 2. Press and turn the front pan...
Page 79 - the Center Frequency; Figure 2-20. Example of Setting the Center Frequency Using a Marker
the Center Frequency 1. Press and turn the front panel knob, or enter a value from the front panel keypad to position the marker at the value that you want for the center frequency. Press to change the center frequency value to the value of the active marker. Figure 2-20. Example of Setting the Cent...
Page 80 - of Setting the; Frequency Span
Setting the Frequency Span You can set the span equal to the spacing between two markers. If you set the center frequency before you set the frequency span, you will have a better view of the area of interest. 1. 2. Turn the front panel knob, or enter a value from the front panel keypad to position ...
Page 81 - Setting the Display Reference; Figure 2-22. Example of Setting the Reference Value Using a Marker; -30 Making Measurements
Setting the Display Reference 1. Press and turn the front panel knob, or enter a value from the front panel keypad to position the marker at the value that you want for the analyzer display reference value. 2. Press to change the reference value to the value of the active marker. . . . . . . . . . ....
Page 82 - Setting the Electrical; Figure 2-23. Example of Setting the Electrical Delay Using a; Setting the CW Frequency; Making Measurements 23 1
Setting the Electrical Delay This feature adds phase delay to a variation in phase versus frequency, therefore it is only applicable for inputs. 2. Press and turn the front panel knob, or enter a value from the front panel keypad to position the marker at a point of interest. . . . . Press to automa...
Page 83 - Example o f; 32 Making Measurements
Search for a Specific Amplitude These functions place the marker at an amplitude-related point on the trace. If you switch on tracking, the analyzer searches every new trace for the target point. Searching for the Maximum Amplitude . . . . . . Press to move the active marker to the maximum point on ...
Page 84 - Searching for the Minimum Amplitude; I I I I I I I; Using; a Marker
Searching for the Minimum Amplitude Press to access the marker search menu. ii. ........ . .. . .. . . Press to move the active marker to the minimum point on the measurement trace. 14 85 I I I I I I I I I I I Figure 2-25. Example of Searching for the Minimum Amplitude Using a Marker Making Measurem...
Page 85 - 34 Making Measurements
Searching for a Amplitude Press to move the active marker to the target point on the measurement trace. 3. If you want to change the target amplitude value (default is -3 press and enter the new value from the front panel keypad. 4. If you want to search for multiple responses at the target amplitud...
Page 86 - Searching for a Bandwidth; the Amplitude that You Are Searching; search
Searching for a Bandwidth The analyzer can automatically calculate and display the -3 bandwidth (BW:), center frequency (CENT:), Q, and loss of the device under test at the center frequency. (Q stands for “quality factor,” as the ratio of a circuit’s resonant frequency to its bandwidth.) These value...
Page 87 - Calculate the Statistics of the Measurement Data; Example Statistics of Measurement Data
Calculate the Statistics of the Measurement Data This function calculates the mean, standard deviation, and peak-to-peak values of the section of the displayed trace between the active marker and the delta reference. If there is no delta reference, the analyzer calculates the statistics for the enti...
Page 88 - Measuring Magnitude and Insertion Phase Response; parameters; Measuring the Magnitude Response; parameters are set as follows:
Measuring Magnitude and Insertion Phase Response The analyzer allows you to make two different measurements simultaneously. You can make these measurements in different formats for the same parameter. For example, you could measure both the magnitude and phase of transmission. You could also measure...
Page 89 - Reconnect your test device.; Figure 2-30. Example Magnitude Response Measurement Results; Measuring Insertion Phase Response; test. The analyzer measures and displays phase over the range of; Figure 2-31. Example Insertion Phase Response Measurement
4. Reconnect your test device. 5. better view the measurement trace, press: . . . . . . . . . . . . . 6. To locate the maximum amplitude of the device response, as shown in Figure 2-30, press: . . . . . . . . . Figure 2-30. Example Magnitude Response Measurement Results Measuring Insertion Phase Res...
Page 91 - Measuring Electrical Length and Phase Distortion; Electrical Length; of earlier analyzers. This feature simulates a variable length; Phase Distortion; deviation from linear phase; Measuring Electrical Length; for Measuring Electrical Length; Press the following keys as shown:; Msasursments
Measuring Electrical Length and Phase Distortion Electrical Length The analyzer mathematically implements a function similar to the mechanical “line stretchers” of earlier analyzers. This feature simulates a variable length transmission line, which you can add to or remove from the analyzer’s receiv...
Page 92 - Phase; span about the marker, measuring the; Making Measurements 241
3. Substitute a thru for the device and perform a response calibration by pressing: Reconnect your test device. 5. To better view the measurement trace, press: . . Notice that in Figure 2-34 the SAW filter under test has considerable phase shift within only a 2 MHz span. Other filters may require a ...
Page 93 - Figure 2-35. Example Best Flat Line with Added Electrical Delay; Measuring Phase Distortion; Deviation From Linear Phase; 42 Making Measurements
8. .. . . . . . . . . . . . .. . . . . . . .. . . . . . . . . . . . .. . . . . length until you achieve the best flat line, as shown in Figure 2-35.The measurement value that the analyzer displays represents the electrical length of your device relative to the speed of light in free space. The physi...
Page 94 - and; Figure 2-36. Deviation From Linear Phase Example Measurement; Group Delay; called; Making Measurements 243
1. 2. 3. 4. Follow the procedure in “Measuring Electrical Length.” increase the scale resolution, press: . . . . To use the marker statistics to measure the maximum peak-to-peak deviation from linear phase, press: M a r k e r F c t n Activate and adjust the electrical delay to obtain a minimum peak-...
Page 95 - Figure 2-37. Group Delay Example Measurement; Group delay measurements may require a specific aperture; Figure 2-38. Group Delay Example Measurement with Smoothing; 44 Making Measurements
3. activate a marker to measure the group delay at a particular frequency, press: and turn the front panel knob, or enter a value from the front panel keypad. Figure 2-37. Group Delay Example Measurement Group delay measurements may require a specific aperture or frequency spacing between measuremen...
Page 96 - Making Measurements 245
5. increase the effective group points over which the analyzer delay aperture, by increasing the number of measurement calculates the group delay, press: As the aperture is increased the “smoothness” of the trace improves markedly, but at the expense of measurement detail. Group Delay Figure 2-39. E...
Page 97 - A Device with Limit Lines; running; Setting Up the Measurement Parameters; Figure 2-40. Connections for SAW Filter Example Measurement; 46 Making Measurements
A Device with Limit Lines Limit testing is a measurement technique that compares measurement data to constraints that you define. Depending on the results of this comparison, the analyzer will indicate if your device either passes or fails the test. Limit testing is implemented by creating individua...
Page 98 - Creating Flat Limit Lines; Making Measurements 247
4. Reconnect your test device. 5. To better view the measurement trace, press: S c a l e R e f ... ......... ..... Creating Flat Limit Lines In this example procedure, the following flat Iimit Iine values are set: Frequency Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...
Page 99 - create a limit line that tests the low side of the filter, press:; 48 Making Measurements
5. To terminate the flat line segment by establishing a single point limit, press: Figure 2-41 shows the flat limit lines that you have just created with the following parameters: n stimulus from 127 MHz to 140 MHz n upper limit of -21 n lower limit of -27 Figure 2-41. Example Flat Limit Line 6. cre...
Page 100 - Creating a Sloping Limit Line; The following; Frequency; access the limits menu and activate the limit lines, press:
Figure 2-42. Example Flat Limit Lines Creating a Sloping Limit Line This example procedure shows you how to make limits that test the shape factor of a SAW The following are set: 1. 2 . Frequency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...
Page 102 - Creating Single Point Limits; In this example procedure, the following; Figure 2-44. Example Single Points Limit Line
Creating Single Point Limits In this example procedure, the following are set: 1. 2 . from -23 to -28.5 at 141 MHz from -23 to -28.5 at 126.5 MHz access the menu and activate the Iimit press: Figure 2-44. Example Single Points Limit Line Making Measurements
Page 103 - Editing Limit Segments; This example shows you how to edit the upper limit of a limit line.; Deleting Limit Segments; access the limits menu and activate the limit lines, press:; Mating Measurements
Editing Limit Segments This example shows you how to edit the upper limit of a limit line. 1. To access the limits menu and activate the limit lines, press: 2. symbol on the analyzer display to the segment you wish to modify, press: 3. To change the upper limit (for example, -20) of a limit line, pr...
Page 105 - Offsetting Limit Lines; ripple in filters with variable loss.; Figure 2-45. Example Stimulus Offset of Limit; offset all of the segments in the limit table by a
Offsetting Limit Lines The limit offset functions allow you to adjust the limit lines to the frequency and output level of your device. For example, you could apply the stimulus offset feature for testing tunable Or, you could apply the amplitude offset feature for testing variable attenuators, or r...
Page 106 - Measuring Gain Compression; at; produce a normalized trace, perform the following steps:
Measuring Gain Compression Gain compression occurs when the input power of an amplifier is increased to a level that reduces the gain of the amplifier and causes a nonlinear increase in output power. The point at which the gain is reduced by 1 is called the 1 compression point. The gain compression ...
Page 107 - This produces a trace that represents gain compression only.; to; change the scale to 1 per division.
b. To uncouple the channel stimulus so that the channel power will be uncoupled, press: 7 . 8 . 9 . 10. 11. This will allow you to separately increase the power for channel 2 and channel 1, so that you can observe the gain compression on channel 2 while channel 1 remains unchanged. c. display the ra...
Page 109 - Figure 2-48. Gain Compression Using Power Sweep
CHZ t I 2 R E F 1 9 0 1 9 9 5 6 1 3 2 B I MRG 5 R E F 1 7 . 6 4 7 4 o k 1 S T A R T - 2 5 . C W 1 MHz S T O P 0 . 0 Figure 2-48. Gain Compression Using Power Sweep Making Measurements
Page 110 - Measuring Gain and Reverse Isolation Simultaneously
Measuring Gain and Reverse Isolation Simultaneously Since an amplifier will have high gain in the forward direction and high isolation in the reverse direction, the gain will be much greater than the reverse isolation Therefore, the power you apply to the input of the amplifier for the forward measu...
Page 112 - Measurements Using the Swept List Mode; Stepped List Mode; Connect the Device Under; Figure 2-50. Swept List Measurement Setup
Measurements Using the Swept List Mode When using a list frequency sweep, the HP 8753E has the ability to sweep arbitrary frequency segments, each containing a list of frequency points. Two different list frequency sweep modes can be selected: Stepped List Mode Swept List Mode In this mode, the sour...
Page 114 - set up the segment for the lower stopband, press
Set Up the Lower Parameters 3. set up the segment for the lower stopband, press . . . . . . . . . . . . . . . . . . . 4. maximize the dynamic in the (increasing the incident power and narrowing the IF bandwidth), press 6. specify a lower power level for the passband, press . . . . . .. . . . . . . ....
Page 115 - Calibrate and Measure
8. e the dynamic range in the (increasing the incident power and narrowing the IF bandwidth), press: . . . . . . . Press i i Calibrate and Measure 1. 2. 3. Remove the DUT and perform a full two-port calibration. Refer to Chapter 5, “Optimizing Measurement Results. With the thru connected, set the sc...
Page 116 - Filter Measurement Using Linear Sweep; Figure 2-53. Filter Measurement Using Swept List Mode
Filter Measurement Using Linear Sweep (Power: 0 BW: 3700 SEGMENT Power: 0 IF BW: Hz SEGMENT 3 Power: IF BW: 300 Hz 2 Power: -10 IF BW: 3700 Hz Figure 2-53. Filter Measurement Using Swept List Mode Making Measurements
Page 117 - Measurements Using the Tuned Receiver Mode; Typical test setup; the tuned receiver mode; by; Connect the equipment as shown in; Setup for Tuned Receiver Mode; Tuned receiver mode in-depth description; Frequency Range; All sweep types may be used.
Measurements Using the Tuned Receiver Mode In the tuned receiver mode, the analyzer’s receiver operates independently of any signal source. This mode is not phase-locked and functions in all sweep types. The analyzer tunes the receiver to a synthesized CW input signal at a precisely specified freque...
Page 118 - External Source Requirements
External Source Requirements An analyzer in tuned receiver mode can receive input signals into PORT 1, PORT 2, or R CHANNEL IN. Input power range specifications are provided in Chapter 7, Specifications and Measurement Uncertainties. Making Measurements
Page 119 - Sequencing; M a k i n g
Sequencing Test sequencing you to automate repetitive tasks. As you make a measurement, the analyzer memorizes the keystrokes. Later you can repeat the entire sequence by pressing a single key. Because the sequence is defined with normal measurement keystrokes, you do not need additional programming...
Page 120 - Creating a Sequence; create or edit a sequence.; Sequencing Help Instructions; select a sequence position in which to store your sequence, press:
Creating a Sequence 1. enter the sequence creation mode, press: As shown in F’igure 2-55, a list of instructions appear on the analyzer display to help you create or edit a sequence. Figure 2-55. Sequencing Help Instructions 2. select a sequence position in which to store your sequence, press: This ...
Page 124 - Changing the Sequence Title; new; Naming Files Generated by a Sequence
Changing the Sequence Title If you are storing sequences on a disk, you should replace the default titles . . . 1. 2. 3. To select a sequence that you want to retitle, press: and select the particular sequence . . . . . The analyzer shows the available title characters. The current title is displaye...
Page 125 - The analyzer will overwrite a on the disk that has the same title.; Do not mistake the line switch for the disk eject button.
Storing a Sequence on a Disk 1. To format a disk, refer to Chapter 4, “Printing, Plotting, and Saving Measurement Results.” 2. To save a sequence to the internal disk, press: . . . . . . . . . . . . . . . . . . . . . . The disk drive access light should turn on briefly. When it goes out, the sequenc...
Page 126 - desired; Printing a Sequence
Loading a Sequence from Disk For this procedure to work, the desired must exist on the disk in the analyzer drive. 1. To view the six sequences on the disk, press: n If the desired sequence is not among the six files, press: :: . . . . . . . . . . . . . . . . . . . 2. Press the next to the title of ...
Page 127 - Cascading Multiple Example Sequences; the sequence loaded into the given position.
Cascading Multiple Example Sequences By cascading test sequences, you can create subprograms for a larger test sequence. You can also cascade sequences to extend the length of test sequences to greater than 200 lines In this example, you are shown two sequences that have been cascaded. You can do th...
Page 128 - Loop Counter Example Sequence; SEQUENCELOOP
Loop Counter Example Sequence This example shows you the basic steps necessary for constructing a looping structure within a test sequence. A typical application of this loop counter structure is for repeating a specific measurement as you step through a series of CW frequencies or dc bias levels Fo...
Page 129 - Generating Files in a Loop Counter Example Sequence
Generating Files in a Loop Counter Example Sequence This example shows how to increment the names of tiles that are generated by a sequence with a loop structure. Start of Sequence LOOP COUNTER 7 xl INTERNAL DISK DATA ONLY ON DO SEQUENCE SEQUENCE 2 Making Measurements
Page 132 - Measuring Swept Harmonics (Option 002 Only); Harmonic Power Levels in
Measuring Swept Harmonics (Option 002 Only) The analyzer has the unique capability of measuring swept second and third harmonics as a function of frequency in a real-time manner. Figure 2-56 displays the absolute power of the fundamental and second harmonic in Figure 2-57 shows the second harmonic’s...
Page 133 - Harmonic Power Level in
B I MRG S R E F 0 1 7 . 6 7 4 2 I I I I I I I I CHZ S T A R T 1 6 . 0 0 0 0 0 0 MHz S T O P 1 0 0 0 . 0 0 0 0 0 0 M H z Figure 2-57. Harmonic Power Level in Making Measurements
Page 134 - Measuring a Device in the Time Domain (Option 010 Only); Gating; Transmission Response in Time Domain; near; TEST PORT
Measuring a Device in the Time Domain (Option 010 Only) The HP 8753E Option 010 allows you to measure the time domain response of a device. Time domain analysis is useful for isolating a device problem in time or in distance. Time and distance are related by the velocity factor of your device under ...
Page 135 - Figure 2-59. Time Domain Transmission Example Measurement
2. choose the measurement parameters, press: 3. Substitute a thru for the device under test and perform a frequency response correction. Refer to “Calibrating the Analyzer,” located at the beginning of this Chapter, for a detailed procedure. 4. Reconnect your device under test. 5. To transform the d...
Page 137 - Gate
2-2. Gate Characteristics Gate Span Minimum Span Normal -68 Span Wide fO.l -57 Span -70 Span I NOTE: With 1601 frequency points, gating is available only the mode. Gate Span Span Span Span I The ripple and levels are descriptive of the gate shape. The cutoff time is the time between the stop time (-...
Page 139 - Reflection Response in Time Domain; Connect your device under test as shown in; -66 Making Measurements
Reflection Response in Time Domain The time domain response of a reflection measurement is often compared with the time domain reflectometry (TDR) measurements. Like the TDR, the analyzer measures the size of the reflections versus time (or distance). Unlike the TDR, the time domain capability of th...
Page 140 - the reflections versus distance along the cable.; Figure 2-64. Device Response in the Frequency Domain; view the time domain over the length
4. To better view the measurement trace, press: . . . . . . . . 2-64 shows the frequency domain reflection response of the cables under test. The complex ripple pattern is caused by reflections from the adapters interacting with each other. By transforming this data to the time domain, you can deter...
Page 141 - Figure 2-65. Device Response in the Time Domain
7. enter the relative velocity of the cable under test, press: and enter a velocity factor for your cable under test. Note Most cables have a relative velocity of 0.66 (for polyethylene dielectrics) or 0.7 (for teflon dielectrics). If you would like the markers to read actual one-way distance rather...
Page 142 - Non-coaxial Measurements
Non-coaxial Measurements The capability of making non-coaxial measurements is available with the HP 8753 family of analyzers with (thru-reflect-line) or (line-reflect-match) calibration. For in-depth information on calibration, refer to Chapter 6, “Application and Operation Concepts. Non-coaxial, on...
Page 144 - Measurement Considerations; Minimizing Source and Load Mismatches
Measurement Considerations ensure successful mixer measurements, the following measurement challenges must be taken into consideration: Mixer Considerations . . . . q Source and Load Mismatches q Reducing the Effect of Spurious Responses q Eliminating Unwanted Mixing and Leakage Signals n Analyzer O...
Page 145 - Figure 3-2. Up Converter Port Connections; Making Mixer
n In a down converter measurement where the is selected, the notation on the analyzer’s setup diagram indicates that the analyzer’s source frequency is labeled RF, connecting to the mixer RF port, and the analyzer’s receiver frequency is labeled IF, connecting to the mixer IF port. Because the RF fr...
Page 146 - Mixer Measurements
Frequency Offset Mode Operation Frequency offset measurements do not begin until all of the frequency offset mode parameters are set. These include the following: n Start and Stop IF Frequencies n frequency n Up Converter Down Converter n The LO frequency for frequency offset mode must be set to the...
Page 147 - External Connection; Mating Mixer Measurements
A N A L Y Z E R Figure 3-3. Channel External Connection 4. Measure the output power in the R channel by pressing: Observe the 13 to 16 offset in measured power. The actual input power level to the R channel input must be 0 or less, -10 typical, to avoid receiver saturation effects The minimum signal...
Page 148 - Power Meter Calibration; Mixer transmission measurements are generally configured as; -6 Making Mixer Measurements
Power Meter Calibration Mixer transmission measurements are generally configured as measured power (watts) /set power (Watts) OR measured set input power For this reason, the set input power must be accurately controlled in order to ensure measurement accuracy.The amplitude variation of the analyzer...
Page 149 - Conversion Loss Using the Frequency Offset Mode; An Example Spectrum of RF, LO, and IF Signals Present in a
Conversion Loss Using the Frequency Offset Mode Conversion loss is the measure of efficiency of a mixer. It is the ratio of side-band IF power to RF signal power, and is usually expressed in express ratios in the power in the denominator must be subtracted from the power in the numerator.) The mixer...
Page 152 - of Measurement Frequencies; Figure 3-8. Measurement Setup from Display
15. To select the converter type and a high-side measurement configuration, press: . . . . . . . . . . . . Notice in this high-side LO, down conversion configuration, the analyzer’s source is sweeping backwards, as shown in Figure 3-7. The measurement setup diagram is shown in Figure 3-8. Figure 3-7...
Page 153 - view the conversion loss in the best vertical resolution, press:; Figure 3-9. Conversion Loss Example Measurement
18. view the conversion loss in the best vertical resolution, press: Figure 3-9. Conversion Loss Example Measurement In this measurement, you set the input power and measured the output power. 3-9 shows the absolute loss through the mixer versus mixer output frequency. If the mixer under test contai...
Page 154 - High Dynamic Range Swept RF/IF Conversion Loss
High Dynamic Range Swept RF/IF Conversion Loss The HP frequency offset mode enables the testing of high dynamic range frequency converters (mixers), by tuning the analyzer’s high dynamic range receiver above or below its source, by a offset. This capability allows the complete measurement of both pa...
Page 155 - Figure 3-10. Connections for Broad Band Power Meter Calibration; Select the HP 8753E as the system controller:; sweep power meter calibration over the IF frequency range at 0; to reduce the number of points before pressing
N E T W O R K A N A L Y Z E R P O W E R M E T E R I I Figure 3-10. Connections for Broad Band Power Meter Calibration 4. Select the HP 8753E as the system controller: 5. Set the power meter’s address: 8. Perform a one sweep power meter calibration over the IF frequency range at 0 Note Because power ...
Page 156 - Connect the measurement equipment as shown in Figure 3-11.; Set the following analyzer parameters:
9. Connect the measurement equipment as shown in Figure 3-11. Figure Connections for Calibration 10. 11. 12. 13. Set the following analyzer parameters: calibrate the B-channel over the IF range, press: Once completed, the analyzer should display 0 Make the connections shown in Figure 3-12. Set the s...
Page 158 - START; -13. Example of Swept IF Conversion Loss Measurement
Figure START MHZ STOP 3-13. Example of Swept IF Conversion Loss Measurement Making Mixer Measurements
Page 159 - Fixed IF Mixer Measurements; Tuned Receiver Mode; addressing
Fixed IF Mixer Measurements A IF can be produced by using both a swept RF and LO that are offset by a certain frequency. With proper filtering, this offset frequency will be present at the IF port of the mixer. This measurement requires two external RF sources as stimuli. Figure 3-15 shows the hardw...
Page 160 - Figure 3-14. Connections for a Response Calibration; Press the following keys on the analyzer to create sequence 1:; keyboard may be used for convenience.; Performing a Response Calibration
A N A L Y Z E R EXT EXT REFERENCE REFERENCE OUT IN 10 EXTERNAL RF SOURCE 6 EXTERNAL LO SOURCE Figure 3-14. Connections for a Response Calibration 4. Press the following keys on the analyzer to create sequence 1: Note enter the following sequence commands that require titling, an external keyboard ma...
Page 161 - the User to; Mixer; to the; Up
the User to a Mixer to the Set Up ... .........A. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Initializing a Loop Counter Value to 26 (xl) (xl) . . ............. . .. . .. ................... . . . . . . . . . . ... . ... . .. .... Addressing and Conflguring...
Page 162 - the Next Measurement Sequence
the Next Measurement Sequence Start of Sequence RECALL PRST STATE SYSTEM CONTROLLER TUNED RECEIVER ADD NUMBER OF POINTS DONE DONELIST FREQ B TITLE PERIPHERAL HPIB ADDR PERIPHERAL TITLE TITLE TO PERIPHERALCALIBRATE: RESPONSECAL STANDARD CLASS TITLE CONNECT MIXER PAUSE LOOP COUNTER SCALE/DIV REFERENCE...
Page 163 - Sequence 2 Setup
TITLE FREQ:MODECW;CW PERIPHERAL DO SEQUENCE Sequence 2 Setup The following sequence makes a series of measurements until 26 CW measurements are made and the loop counter value is equal to zero. This sequence includes: n taking data n incrementing the source frequencies decrementing the loop counter ...
Page 165 - Figure 3-16. Example Fixed IF Mixer Measurement; the same tied IF frequency.; Mating Mixer Measurements 3-23
S T A R T 1 0 0 . 0 0 0 S T A R T 1 0 0 . 0 0 0 S T O P 1 0 0 . 0 0 0 M H Z S T O P 1 0 0 . 0 0 0 M H Z Figure 3-16. Example Fixed IF Mixer Measurement Figure 3-16. Example Fixed IF Mixer Measurement The displayed trace represents the conversion loss of the mixer at 26 points. Each point corresponds...
Page 166 - Phase or Group Delay Measurements; source is set to the following values:; connector saver for R CHANNEL IN.; -24 Making Mixer Measurements
Phase or Group Delay Measurements For information on group delay principles, refer to “Group Delay Principles” in Chapter 6. The accuracy of this measurement depends on the quality of the mixer that is being used for calibration and how well this mixer has been characterized. The following measureme...
Page 167 - for a Group Delay Measurement
550 MHz LOW PASS FILTER 10 10 REFERENCE CALIBRATION MIXER MIXER CONVERTER EXTERNAL LO SOURCE Figure 3-17. for a Group Delay Measurement 5. set the frequency offset mode LO frequency from the analyzer, press: . . . . . . . . 6. To select the converter type and a high-side LO measurement configuration...
Page 168 - Scale the data for best vertical resolution.; Figure 3-18. Group Delay Measurement Example; which requires
8. To make a response error-correction, press: 9. Replace the “calibration” mixer with the device under test. If measuring group delay, set the delay equal to the “calibration” mixer delay (for example -0.6 ns) by pressing: 10. Scale the data for best vertical resolution. CorDel Smo Hld Ofs -CENTER ...
Page 169 - Amplitude and Phase Tracking; Replace the calibration mixer with the mixer under test.; Making Mixer Measurements 3-27
Amplitude and Phase Tracking Using the same measurement setup as in “Phase or Group Delay Measurements,” you can determine how well two mixers track each other in terms of amplitude and phase. 1. Repeat steps 1 through 8 of the previous “Group Delay Measurements” section with the following exception...
Page 170 - Conversion Compression Using the Frequency Offset Mode; mixer’s
Conversion Compression Using the Frequency Offset Mode Conversion compression is a measure of the maximum RF input signal level, where the mixer provides linear operation. The conversion loss is the ratio of the IF output level to the RF input level. This value remains constant over a specified inpu...
Page 171 - view the absolute input power to the analyzer’s R channel, press:
Caution prevent connector damage, use an adapter (HP part number 1250-1462) as a connector saver for R CHANNEL IN. NETWORK ANALYZER Figure 3-20. Connections for the First Portion of Conversion Compression Measurement 5. view the absolute input power to the analyzer’s R channel, press: 6. To store a ...
Page 172 - MIXER; 30 Making Mixer Measurements
Caution To prevent connector damage, use an adapter (HP part number 1250-1462) as a connector saver for R CHANNEL IN. NETWORK ANALYZER Figure 3-21. MIXER UNDER TEST 3 EXTERNAL LO SOURCE Connections for the Second Portion of Conversion Compression Measurement 8. set the frequency offset mode frequenc...
Page 173 - The measurements setup diagram is shown in Figure 3-22.; Figure 3-22. Measurement Setup Diagram Shown on Analyzer Display; See
The measurements setup diagram is shown in Figure 3-22. NETWORK ANALYZER CW. 200 MHz CW: BOO MHz 600 MHz 13 FREO OFFS ON off LO MENUDOWN CONVERTER UP CONVERTER RF LO I RF < LO VIEW MEASURE RETURN Figure 3-22. Measurement Setup Diagram Shown on Analyzer Display 11. To view the mixer’s output power...
Page 174 - Example Swept Power Conversion Compression Measurement
Figure 3-23. Example Swept Power Conversion Compression Measurement Making Mixer Measurements
Page 175 - Isolation Example Measurements; Figure 3-24. Signal Flow in a Mixer Example; LO to
Isolation Example Measurements Isolation is the measure of signal leakage in a mixer. Feedthrough is the forward signal leakage to the IF port. High isolation means that the amount of leakage or feedthrough between the mixer’s ports is very small. Isolation measurements do not use the frequency offs...
Page 176 - Measurement Results.”; LOAD; Figure 3-26. Connections for a Mixer Isolation Measurement; The measurement results show the mixer’s LO to RF isolation.
A N A L Y Z E P Note A full 2 port calibration will increase the accuracy of isolation measurements. Refer to Chapter 5, Measurement Results.” 6. Make the connections as shown in Figure 3-26. NETWORK ANALYZER L O R F I F LOAD Figure 3-26. Connections for a Mixer Isolation Measurement 7. adjust the d...
Page 177 - I I I; Figure 3-27. Example Mixer to RF Isolation Measurement; RF Feedthrough; CW frequency = 300 MHz; conditions as possible.
I I I Figure 3-27. Example Mixer to RF Isolation Measurement RF Feedthrough The procedure and equipment configuration necessary for this measurement are very similar to those above, with the addition of an external source to drive the mixer’s port as we measure the mixer’s RF feedthrough. RF feedthr...
Page 178 - Figure 3-28. Connections for a Response Calibration; Make the connections as shown in; SOURCE; Figure 3-29. Connections for a Mixer Feedthrough Measurement; by reducing the IF bandwidth.
N E T W O R K A N A L Y Z E R 6. 7. Figure 3-28. Connections for a Response Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Make the connections as shown in Figure NETWORK ANALYZER SOURCE Figure 3-29. Connections for a Mixer Feedthrough Measurement 8. Connect the ex...
Page 179 - Figure 3-30. Example Mixer RF Feedthrough Measurement; Use the analyzer source as the IF signal drive.
Figure 3-30. Example Mixer RF Feedthrough Measurement You can measure the IF to RF isolation in a similar manner, but with the following modifications: n Use the analyzer source as the IF signal drive. n View the leakage signal at the RF port. Making Mixer Measurements
Page 180 - and Saving Measurement Results
Printing, Plotting, and Saving Measurement Results This chapter contains instructions for the following tasks: Printing or plotting your measurement results a print function •I Defining a print function Printing one measurement per page Printing multiple measurements per page Printing time Configuri...
Page 181 - measurements or using particular functions.; Plotting, and Saving Measurement Results
Where to Look for More Information Additional information about many of the topics discussed in this chapter is located in thefollowing areas: n Chapter 2, “Making Measurements, contains step-by-step procedures for making measurements or using particular functions. Chapter 8, “Menu Maps, shows menu ...
Page 182 - switch off the; Printing, Plotting, and Saving Measurement Results 4 3
Printing or Plotting Your Measurement Results You can print your measurement results to the following peripherals: printers with HP-IB interfaces n printers with parallel interfaces printers with serial interfaces You can plot your measurement results to the following peripherals: HPGL compatible pr...
Page 183 - Printing, Plotting, and Saving Measurement
HP . . . . . . . q (printers that conform to the printer control language) . . . •I (for use with the HP DeskJet 540 and DeskJet .. . ..... . . . . . . . . ... Note If your DeskJet printer does not support the 100 dpi and 3. Select one of the following printer interfaces: a. Enter the HP-IB address ...
Page 184 - Defining a Print Function; Printing, Plotting, and Saving Measurement Results
. Choose if your printer has a serial interface, and then configure the print .. . . function as follows: b. select the transmission control method that is compatible with your printer, press (transmit control handshaking protocol) until the correct method appears. q If you choose the handshake meth...
Page 185 - you do not want that element to appear on your hardcopy.; Reset the Printing Parameters to Default Values; Printing One Measurement Per Page; Function; a Print Function” located earlier in this chapter.
If Are Using a Color Printer 2. If you want to modify the print colors, select the print element and then choose an available color. Note You can set all the print elements to black to create a hardcopy in black andwhite. Since the media color is white or clear, you could set a print element to whit...
Page 186 - Printing Multiple Measurements Per Page
Printing Multiple Measurements Per Page 1. Configure and define the print function, as explained in a Print Function” and “Defining a Print Function” located earlier in this chapter. . . i..: i.. . . . ii 4. Make the next measurement that you want to see on your hardcopy. 4-2 shows an example of a h...
Page 188 - method
a. Enter the HP-IB address of the printer (default is 01), followed by the HP-IB bus. . . . c. Press and if there is an external controller connected to the HP-IB bus. the print function as . . . q Press and then select the parallel port interface function by pressing until the correct function appe...
Page 190 - I S K U N I T N U M B E R .
If You Are Plotting to a Disk Drive Caution Do not mistake the line switch for the disk eject button. See the below. If the line switch is mistakenly pushed, the instrument will be turned off,losing all settings and data that have not been saved. D I S K E J E C T B U T T O N L I N E S W I T C H ’ T...
Page 191 - Defining a Plot Function; Figure 4-4. Plot Components Available through Definition
Defining a Plot Function Note The plot definition is set to default values whenever the power is cycled.However, you can save the plot definition by saving the instrument state. Choosing Display Elements 2. Choose which of the following measurement display elements that you want to appear on your pl...
Page 192 - -2. Default Pen Numbers and Corresponding Colors; Corresponding Key
Note Selecting Pen Numbers and Colors Press and select the plot element where you want to change the pen number. For example, press and then modify the pen number. The pen number selects . . . . . . . . . . . . . . . . .../.... the color if you are plotting to an compatible color printer. Press afte...
Page 193 - Selecting Line Types; -4. Default Line Types for Plot Elements
Selecting Line Types Press and select each plot element line type that you want to modify. q to modify the line type for the data trace. Then enter the new type (see Figure followed by to the type for the memory trace. Then enter the . . . . . . . . . . . . . . . . . . new line type (see followed by...
Page 194 - Choosing Scale
Choosing Scale 6. q . . . . . . . . . . . i.... . . . . . . . . . includes space for all display annotations such as marker values and stimulus values. Theentire analyzer display fits within the defined boundaries of and on the plotter, while maintaining the exact same aspect ratio as the display. ....
Page 195 - Reset the Plotting Parameters to Default Values; Plotting One Measurement Per Page Using a Pen Plotter; Plot Function” located earlier in this chapter.
Reset the Plotting Parameters to Default Values 4-5. Plotting Parameter Default Values Marker I 7 Plotting One Measurement Per Page Using a Pen Plotter 1. Configure and define the plot, as explained in “Configuring a Plot Function” and “Defining a Plot Function” located earlier in this chapter. OUTP...
Page 196 - Plotting Multiple Measurements Per Page Using a Pen Plotter
Plotting Multiple Measurements Per Page Using a Pen Plotter 1. Configure and the plot, as explained in “Configuring a Plot Function” and a Plot located earlier in this chapter. 3. Choose the quadrant where you want your displayed measurement to appear on the hardcopy. The following quadrants are ava...
Page 198 - Plotting a Measurement to Disk; Figure 4-8. Automatic File Naming Convention for
Plotting a Measurement to Disk The plot that you generate from the analyzer, contain the HPGL representation of the measurement display. The will not contain any setup or formfeed commands. 1. the analyzer to plot to disk. Press . Press The analyzer assigns the available default for the displayed di...
Page 199 - Output the Plot Files; To View Plot Files on a PC; must; Printing, Platting, and Saving Measurement Results
Output the Plot Files n You can plot the to a plotter from a personal computer. n You can output your plot files to an HPGL compatible printer, by following the sequence in “Outputting Plot Files from a PC to an HPGL Compatible Printer” located later in this chapter. You can a program that plots all...
Page 201 - wish; Outputting Plot Files from a PC to a Plotter
Using Freelance view plot files in Freelance, perform the following steps: 1. From the FILE pull-down menu, select IMPORT. 2. Set the type in the dialog box to HGL. Note The network analyzer does not use the *.HGL, so you may want to change the filter to or some other pattern that will allow you to ...
Page 202 - Outputting Plot Files from a PC to an HPGL Compatible Printer; in; Step 1. Store the HPGL initialization sequence.; Initialization Commands
Outputting Plot Files from a PC to an HPGL Compatible Printer To output the plot files to an HPGL compatible printer, you can use the HPGL initializationsequence linked in a series as follows: Step 1. Store the HPGL initialization sequence a named hpglinit. Step 2. Store the exit HPGL mode and form ...
Page 203 - Step 2. Store the exit HPGL mode and form feed sequence.; File Commands; Step 3. Send the HPGL initialization sequence to the printer.; Outputting Single Page Plots Using a Printer; Remark; Saving Measurement Results
Step 2. Store the exit HPGL mode and form feed sequence. 1. Create a test file by typing in each character as shown in the left hand of 4-7. Do not insert spaces or linefeeds. 2. Name the file exithpgl. 4-7. HPGL File Commands Command Remark I Step 3. Send the HPGL initialization sequence to the pri...
Page 204 - Outputting Multiple Plots to a Single Page Using a Printer
Outputting Multiple Plots to a Single Page Using a Printer Refer to the “Plotting Multiple Measurements Per Page Using a Disk Drive, located earlier inthis chapter, for the naming conventions for plot that you want printed on the same page. You can use the following batch to automate the plot printi...
Page 205 - Plotting Multiple Measurements Per Page From Disk; Programmer’s; Plot Multiple Measurements on a Full Page; Printing, Plotting. and Saving Measurement Results
Plotting Multiple Measurements Per Page From Disk The following procedures show you how to store plot files on a LIF formatted disk. A naming convention is used so you can later run an HP BASIC program on an external controller that will output the to the following peripherals: n a plotter with auto...
Page 207 - Plot Measurements in Page Quadrants
Plot Measurements in Page Quadrants 1. the plot, as explained in the Plot Function” located earlier in this chapter. 3. Choose the quadrant where you want your displayed measurement to appear on the . . . . . . . . . . . . . hardcopy. The selected quadrant appears in the brackets under . . . . . . ....
Page 208 - Titling the Displayed Measurement
Titling the Displayed Measurement You can create a title that is printed or plotted with your measurement result. 1. . . . . . . . . 3. Turn the front panel knob to move the arrow pointer to the character of the title. 5. Repeat the previous two steps to enter the rest of the characters in your titl...
Page 209 - the Analyzer to Produce a Time Stamp; Aborting a Print or Plot Process; Want a Single Page of Values; page of
the Analyzer to Produce a Time Stamp You can set a clock, and then activate it, if you want the time and date to appear on your hardcopies. by ( X 1 ) . . . . . . . . . . . . . . . . . . . . . . . . . Press and enter the current day of the month, followed by Press and enter the current hour of the d...
Page 210 - If You Want the Entire List of Values; Choose; If you are printing the list of operating parameters, only the
3. Repeat the previous two steps until you have created hardcopies for all the desired pages of listed values. If you are printing the list of measurement data points, each page contains 30 lines of data.The number of pages is determined by the number of measurement points that you haveselected unde...
Page 211 - Solving Problems with Printing or Plotting
Solving Problems with Printing or Plotting If you encounter a problem when you are printing or plotting, check the following list forpossible causes: n Look in the analyzer display message area. The analyzer may show a message that will identify the problem. Refer to the “Error Messages” chapter if ...
Page 212 - Saving and Recalling Instrument States; Places Where; days; What You Can Save to a Floppy Disk
Saving and Recalling Instrument States Places Where Can Save n analyzer internal memory n floppy disk using the analyzer’s internal disk drive n floppy disk using an external disk drive IBM compatible personal computer using HP-IB mnemonics What You Can Save to the Analyzer’s Internal Memory The num...
Page 213 - What You Can Save to a Computer; Instrument states can be saved to and recalled from; For an example program, refer to “Saving
What You Can Save to a Computer Instrument states can be saved to and recalled from external computer (system controller) using HP-IB mnemonics. For more information about the specific analyzer settings that can be saved, refer to the output commands located in the “Command Reference” chapter of the...
Page 214 - Saving an Instrument State
Saving an Instrument State Press and select one of the storage devices: . . . . . . . . . . 0 . . . . . . . . . . . q connect an external disk drive to the analyzer’s HP-IB connector, and i . . . as follows: (Local) followed by If your storage disk is partitioned, press and enter the volume number w...
Page 215 - Save; 3 6 Printing, Platting, and Saving Measurement Results
Saving Measurement Results Instrument states combined with measurements results can only be saved to disk. Files that . . . . . . . . . contain data-only, and the various save options available under the key, are also only valid for disk saves. The analyzer stores data in arrays along the processing...
Page 216 - Figure 4-12. Data Processing Flow Diagram
R A W D A T A E R R O R D A T A TRACE A V E R A G I N G A R R A Y S A R R A Y S M A T H I I I I ( O P T 0 1 0 ) T R A N S F O R M( O P T S M O O T H I N G A R R A Y S Figure 4-12. Data Processing Flow Diagram Note If the analyzer has an active two-port measurement calibration, allfour S-parameters w...
Page 217 - “ASCII Data Formats.
f. Press and select one of the following: . . . . . . Choose to allow the analyzer to control peripherals directly. peripheral access operations. q . . allows the analyzer to take or pass control. 4 . . . . . . . . . . . . 5. Define the save by selecting one of the following choices: , . . . . . . ....
Page 218 - ASCII Data Formats; Data Format
ASCII Data Formats CITIFile (Common Instrumentation Transfer and Interchange is an ASCII data format that is useful when exchanging data between different computers and instruments. are always saved when the ASCII format has been selected as shown below: . . . . . . . . . . . . . . . . . . . . . . ....
Page 220 - Re-Saving an Instrument State
Re-Saving an Instrument State If you re-save a the analyzer overwrites the existing file contents. Note You cannot re-save a that contains data only. You must create a new file. Delete an Instrument State File q Press the keys or the front panel knob to the name of the that you want to delete. __ se...
Page 221 - Renaming a File; 4 2 Printing, Plotting, and Saving Measurement Results
Renaming a File 2. Choose from the following storage devices: ... . . . . . . . . . . . . . . . . . . . . . q . . . . . the that you want to rename. . . . . . . 5. Turn the front panel knob to point to each character of the new . . . . . . . . .... . . . . . . . . . . . . . . . .. . .. . . . . . . ....
Page 222 - If
Formatting a Disk 2. Choose the type of format you want: Solving Problems with Saving or Recalling Files If you encounter a problem when you are storing to disk, or the analyzer internal memory, check the following list for possible causes: Look in the analyzer display message area. The analyzer may...
Page 223 - Optimizing Measurement Results
Optimizing Measurement Results This chapter describes techniques and analyzer functions that help you achieve the bestmeasurement results. The following topics are included in this chapter: n Increasing measurement accuracy Connector repeatability q Interconnecting cables Temperature drift Frequency...
Page 224 - Connector Repeatability
Where to Look for More Information Additional information about many of the topics discussed in this chapter is located in thefollowing areas: Chapter 2, Measurements,” contains step-by-step procedures for making measurements or using particular functions. n Chapter 4, “Printing, Plotting, and Savin...
Page 225 - Differences between PORT EXTENSIONS and; Optimizing Measurement Results 6 3
Frequency Drift Minute changes in frequency accuracy and stability can occur as a result of temperature andaging (on the order of parts per million). If you require greater frequency accuracy, do the following: Override the internal crystal with a high-stability external source, frequency standard, ...
Page 226 - Measurement Error-Correction; Conditions Where Error-Correction is Suggested
Measurement Error-Correction The accuracy of network analysis is greatly influenced by factors external to the network analyzer. Components of the measurement setup, such as interconnecting cables and adapters, introduce variations in magnitude and phase that can mask the actual response of the devi...
Page 227 - -2. Purpose and Use of Different Error-Correction Procedures; Optimizing Measurement Results 5-5
5-2. Purpose and Use of Different Error-Correction Procedures Response Response isolation Full Corresponding Measurement Transmission or reflection measurement when the highest accuracy is not required. Transmission of high insertion loss devices or reflection of high return loss devices. Not as acc...
Page 228 - Calibration Standards; Compensating; for the Electrical Delay of calibration Standards; working; Connector Sex; When to Use Interpolated Error-Correction
Calibration Standards The quality of the error-correction is limited by two factors: (1) the difference between themodel of the calibration standards and the actual electrical characteristics of those standards,and (2) the condition of the calibration standards. lb make the highest quality measureme...
Page 230 - Procedures for Error-Correcting Your Measurements; -8 Optimizing Measurement Results
Procedures for Error-Correcting Your Measurements This section has example procedures or information on the following topics: n frequency response correction n frequency response and isolation correction n one-port reflection correction n full two-port correction n correction n modifying calibration...
Page 231 - Frequency Response Error-Corrections; Response Error-Correction for Reflection Measurements
Frequency Response Error-Corrections You can remove the frequency response of the test setup for the following measurements: n reflection measurements transmission measurements n combined reflection and transmission measurements Response Error-Correction for Reflection Measurements 1. Press 2. Selec...
Page 232 - Standard Connections for
NETWORK ANALYZER TEST POPT CABLES SHORT OPEN SHORT OPEN FOR RESPONSE Figure 5-1. Standard Connections for a Response Error-Correction for Reflection Measurement q To measure the standard when the displayed trace has settled, press: If the calibration kit you selected has a choice between male and fe...
Page 233 - WAIT MEASURING CAL STANDARD; underlines
Response Error-Correction for Transmission Measurements 1. Press 2. Select the type of measurement you want to make. q If you want to make a transmission measurement in the forward direction press: q If you want to make a transmission measurement in the reverse direction press: 3. Set any other meas...
Page 234 - Results” chapter for procedures.; Receiver Calibration; later in this chapter.; Figure 5-3. Standard Connections for Receiver Calibration
Note use an open or short standard for a transmission response correction, Note You can save or store the measurement correction to use for latermeasurements. Refer to the ‘Printing, Plotting, and Saving Measurement Results” chapter for procedures. 7. This completes the response correction for trans...
Page 235 - You can save or store the measurement correction to use for later
Note You can save or store the measurement correction to use for later measurements. Refer to the “Printing, Plotting, and Saving MeasurementResults” chapter for procedures. 7. This completes the receiver calibration for transmission measurements. You can connect and measure your device under test. ...
Page 236 - Frequency Response and Isolation Error-Corrections; have
Frequency Response and Isolation Error-Corrections n removes frequency response of the test setup n removes isolation in transmission measurements removes directivity in reflection measurements You can make a response and isolation correction for the following measurements: reflection measurements t...
Page 238 - -16 Optimizing Measurement Results
Response and Isolation Error-Correction for Transmission Measurements This procedure is intended for measurements that have a measurement range of greater than 9 0 1. Press 2. Select the type of measurement you want to make. q If you want to make a transmission measurement in the forward direction p...
Page 241 - Optimizing
NETWORK ANALYZER ES OPEN SHORT OPEN SHORT LOAD FOR FOP Figure 5-6. Standard Connections for a One Port Reflection Error-Correction 8. To measure the standard, when the displayed trace has settled, press: Note If the calibration kit that you selected has a choice between male or female calibration st...
Page 242 - measure your device under test.
Note You can save or store the error-correction to use for later measurements. Refer to the “Printing, Plotting, and Saving Measurement Results” chapter forprocedures. 14. This completes the one-port correction for reflection measurements. You can connect and measure your device under test. Optimizi...
Page 243 - other correction procedures.; for Nl Two port Error-Correction; Optimizing Measurement
Full Two-Port Error-Correction n removes directivity errors of the test setup in forward and reverse directions n removes source match errors of the test setup in forward and reverse directions removes load match errors of the test setup in forward and reverse directions n removes isolation errors o...
Page 247 - performing the numerical calculations of error coefficients.; This must be done before performing the following sequence.; test ports; Refer to “Choosing Calibration Load Standards.”; Optimizing Measurement Results 5-25
11. 12. 13. Connect a load to PORT 2, and press: Connect the load to PORT 1, and press: You may repeat any of the steps above. There is no requirement to go in the order ofsteps. When the analyzer detects that you have made all the necessary measurements, the . . . . . . . . . . . . . . . . . . .. ....
Page 250 - Corresponding Number
5-3. Typical Calibration Kit Standard Corresponding Number Default Standard Type Number short (m) 1 2 broadband load 3 4 sliding load 5 load 6 short 7 8 5. Press the underlined For example, if you selected (xl) in the previous step, should be the underlined Note press a that is not underlined unless...
Page 251 - Modify the Standard Definitions
Saving the calibration constants If you made modifications to any of the standard detlnitions, follow the steps in this procedure to assign a kit label, and store them the non-volatile memory. The new set of standard will be available under you save another user kit. Press . Use the front panel knob...
Page 252 - For; Assign the Standards to the Various
4. To the standard, press: 5. the LINE/MATCH standard, press: . . . . . . . . ... . . . . . . . . . . . . . . . . . . . . . . .../.. . . . . . . . 6. For the purposes of this example, change the name of the standard by pressing . . . . ... ...... and modifying the name to “LINE.” 7. When the title a...
Page 253 - the Classes; the Calibration Kit; Modifying; Modify the Standard; Measurement Results 531
the Classes Note enter the following label titles, an external keyboard may be used for convenience. : . . . . 14. Change the label of the “TRL REFLECT” class to “TRLSHORT.” 15. Change the label of the “TRL LINE OR MATCH” class to “TRLLINE. 16. Change the label of the “TRL THRU” class to . the Calib...
Page 254 - if a previous title; Assign the
4. the standard, press: 5. To define the LINE/MATCH standard, press: 6. For the purposes of this example, change the name of the standard if a previous title . . . . . . . . . . . . . ../...................... . . . . . . . . . . and then modify the name to “MATCH”. 7. When the title area shows the ...
Page 255 - Change the label of the “TRL REFLECT” class to “TRMSHORT.”
the Classes Note enter the following label titles, an external keyboard may be used for convenience. . . . 14. Change the label of the “TRL REFLECT” class to “TRMSHORT.” 15. Change the label of the “TRL LINE OR MATCH” class to Optimizing Measurement Results
Page 257 - Optimizing Measurement Results 535
Entering the Power Sensor Calibration Data Entering the power sensor calibration data compensates for the frequency response of the power sensor, thus ensuring the accuracy of power meter calibration. 1. Make sure that your analyzer and power meter are configured. Refer to the “Compatible Peripheral...
Page 258 - Deleting Frequency Segments; Compensating for Directional Coupler Response; -36 Optimizing Measurement
Deleting Frequency Segments Access the “Segment Modify Menu” by pressing . . . . . , that you want to delete). Identify the segment that you want to delete by pressing and using the and keys to locate and position the segment next to the pointer shown on the display. Or press and enter the segment n...
Page 259 - continuous correction mode.; Select the HP 8753E as the system controller:; Optimizing Measurement Results 537
Using Sample-and-Sweep Correction Mode You can use the sample-and-sweep mode to correct the analyzer output power and update the power meter correction data table, during the initial measurement sweep. Because the analyzer measures the actual power at each frequency point during the initial sweep, t...
Page 260 - points original; -9. Continuous Correction Mode for Power Meter Calibration; 3 8 Optimizing Measurement Results
Note Because power meter calibration requires a longer sweep time, you may want power meter calibration is return the number of points original value and the analyzer will automatically interpolate this calibration. Some accuracy will be lost for the interpolated points. The analyzer will use the da...
Page 262 - Calibrating for Noninsertable Devices; and one of the following calibration methods must be performed:; 4 0 Optimizing Measurement Results
Calibrating for Noninsertable Devices A test device having the same sex connector on both the input and output cannot be connected directly into a transmission test configuration. Therefore, the device is considered to be and one of the following calibration methods must be performed: n adapter remo...
Page 263 - Adapter Removal; A l
The adapter removal technique provides a means to accurately measure noninsertable devices.The following adapters are needed: Adapter Al, which mates with port 1 of the device, must be installed on test set port 1. n Adapter which mates with port 2 of the device, must be installed on test set port 2...
Page 264 - Perform the Z-port Error Corrections; Cal Set 1; 4 2 Optimizing Measurement Results
Perform the Z-port Error Corrections 1. Connect adapter to adapter on port 2. (See 5-12.) N E T W O R K REFERENCE PORT REFERENCE Figure 5-12. Cal Set 1 2. Perform the error correction using calibration standards appropriate for the connector type at port 1. Note When using adapter removal calibratio...
Page 265 - Remove the Adapter; Optimizing Measurement Results 543
4. Connect adapter to adapter Al on port 1. (See 5-13.) N E T W O R K A N A L Y Z E R REFERENCE PORT 2 Figure 5-13. Two-Port Cd Set 2 5. Perform the error correction using calibration standards appropriate for the connector type at port 2. 6. Save the results to disk. Name the 7. Determine the elect...
Page 266 - D U T; Measurement
Note In the following two steps, calibration data is recalled, not instrument states. 10. the disk directory, choose the file associated with the port 1 error correction, then . . . . . . . 11. When this is complete, choose the for the port 2 error correction and press I’... . When complete, press 1...
Page 267 - Example Program; Optimizing Measurement Results 645
If unexpected phase variations are observed, indicates that the delay of adapter not specified a quarter wavelength over the frequency of correct this, recall both sets, since data was previously stored to disk, change the . . . . . . . . . . . . . . . . . Example Program following is an program for...
Page 268 - Adapters; insertion loss, and electrical delay. The adapters; Figure 5-15. Calibrating for Noninsertable Devices; Perform a transmission calibration using the; 4 6 Optimizing Measurement Results
Adapters With this method, you use two precision matched adapters which are “equal. lb be equal,the adapters must have the same match, insertion loss, and electrical delay. The adapters in most HP calibration kits have matched electrical length, even if the physical lengths appear different. NON-INS...
Page 269 - Modify the Cal Kit; Optimizing Measurement Results 647
Modify the Cal Kit With this method it is only necessary to use adapter B. The calibration kit thru definition is modified to compensate for the adapter and then saved as a user kit. However, the electrical delay of the adapter must be found. 1. Perform a l-port calibration on PORT 2. 2. Connect ada...
Page 270 - Making Accurate Measurements of Electrically Long Devices; The Cause of Measurement Problems; 4 8 Optimizing Measurement Results
Making Accurate Measurements of Electrically Long Devices A device with a long electrical delay, such as a long length of cable or a SAW presents some unusual measurement problems to a network analyzer operating in swept frequency mode. Often the measured response is dependent on the analyzer’s swee...
Page 271 - Decreasing the Time Delay; approximately the same delay as the device under test.
Decreasing the Time Delay The other way to reduce is by decreasing the time delay, AT. Since AT is a property of the device that is being measured, it cannot literally be decreased. However, what can be decreased is the difference in delay times between the paths to the R channel and the B channel. ...
Page 272 - Increasing Sweep Speed; Use Swept List Mode
Increasing Sweep Speed You can increase the analyzer sweep speed by avoiding the use of some features that require computational time for implementation and updating, such as bandwidth marker tracking.You can also increase the sweep speed by making adjustments to the measurement settings. The follow...
Page 273 - Band; Set the Auto Sweep Time Mode
3. Then switch to stepped mode: n If there is no difference between the measurements in either mode, then use the swept mode. n If the memory trace indicates that there is more attenuation in swept mode, it may be due to IF delay. You can remedy this problem by increasing the sweep time. Note IF ban...
Page 274 - Widen the System Bandwidth; Set the IF bandwidth to change the sweep time.; Reduce the Averaging; slow the sweep time slightly, in narrow spans.; Reduce the Number of Measurement Points; press
Widen the System Bandwidth 1. 2. Set the IF bandwidth to change the sweep time. The following table shows the relative increase in sweep time as you decrease system bandwidth. 3000 0.128 0.254 1 Preset condition, Span-= includes retrace time. Reduce the Averaging By reducing the averaging factor (nu...
Page 275 - Set the Sweep Type
The analyzer sweep time does not change proportionally with the number of points, but as indicated below. 201 0.106 401 0.181 801 0.330 1601 0.633 1 Preset condition, CF- Span= Correction includes retrace Measurement speed can be improved by selecting the widest IF BW setting of Set the Sweep Type D...
Page 276 - Use; test
Activate Chop Sweep Mode You can use the chop sweep mode to make two measurements at the same time. For example, the analyzer can measure A/R and B/R simultaneously. You can activate the chop mode by pressing or by the following the sequence below. For more information, refer to “Alternate and Chop ...
Page 277 - Optimizing Measurement Results 5-55
4. enter the number of sweeps, press: Optimizing Measurement Results 5-55
Page 278 - Increasing Dynamic Range
Increasing Dynamic Range Dynamic range is the difference between the analyzer’s maximum allowable input level and minimum measurable power. For a measurement to be valid, input signals must be within these boundaries. The dynamic range is affected by these factors: test port input power n test port ...
Page 279 - Reducing Trace Noise; Activate Averaging; Reducing Receiver Crosstalk
Reducing Trace Noise You can use two analyzer functions to help reduce the effect of noise on the data trace: n activate measurement averaging n reduce system bandwidth Activate Averaging The noise is reduced with each new sweep as the effective averaging factor increments. 2. Enter a value followed...
Page 280 - Reducing Recall Time; will avoid generating the sampler offset table.; Channel
Reducing Recall Time ‘lb reduce time during recall and frequency changes, the raw offset function and the spur avoidance function can be turned off. turn these functions off, press : , The raw offset function is normally on and controls the sampler and attenuator offsets. The spur avoidance function...
Page 281 - Understanding Spur Avoidance; the output. These spurs can become apparent in
Understanding Spur Avoidance In the 400 MHz to 3 range, where the source signal is created by heterodyning two higher frequency oscillators, unwanted spurious mixing products from the source may be present at the output. These spurs can become apparent in measurements when filters have greater than ...
Page 282 - Application and Operation Concepts
This chapter provides conceptual information on the following primary operations and applications that are achievable with the HP 8753E network analyzer. n HP 8753E System operation Data processing n Active channel keys n Entry block keys n Stimulus functions Response functions n S-parameters n Disp...
Page 283 - source; Block Diagram of the Network Analyzer System; The Built-In Synthesized Source; The Source Step Attenuator
HP 8753E System Operation Network analyzers measure the reflection and transmission characteristics of devices and networks. A network analyzer test system consists of the following: n source n signal-separation devices n receiver n display The analyzer applies a signal that is transmitted through t...
Page 284 - Set; sampler/mixers in the receiver. Port 1 is; The Receiver Block; are sampled, and mixed to produce a 4; The Microprocessor; sequence is described in “Data Processing” later in this chapter.; Required Peripheral Equipment
The Built-In Set The HP 8753E features a built-in test set that provides connections to the test device, as well as to the signal-separation devices. The signal separation devices are needed to separate the incident signal from the transmitted and reflected signals. The incident signal is applied to...
Page 285 - 4 Application and Operation Concepts
Data Processing The analyzer’s receiver converts the R, A, and input signals into useful measurement information. This conversion occurs in two main steps: n The swept high frequency input signals are translated to low frequency IF signals, using analog sampling or mixing techniques. (Refer to the H...
Page 286 - Data point definition:; Processing Details; Detection
While only a single flow path is shown, two identical paths are available, corresponding to channel 1 and channel 2. When the channels are uncoupled, each channel is processed and controlled independently. Data point definition: A “data point” or “point” is a single piece of data representing a meas...
Page 287 - Arrays; Accuracy; Trace Math Operation; Application and Operation Conwpts
Pre-Raw Data Arrays These data arrays store the results of the preceding data processing operations. (Up to this point, all processing is performed real-time with the sweep by the IF processor. The remaining operations are not necessarily synchronized with the sweep, and are performed by the main pr...
Page 289 - Active Channel Keys; -6 Application and Operation Concepts
Active Channel Keys The analyzer has four channels for making measurements. Channels 1 and 2 are the primary channels and channels 3 and 4 are the channels. The primary channels can have different stimulus values (see “Uncoupling Stimulus Values Between Primary Channels,” below) but the auxiliary ch...
Page 290 - Entry Block Keys
Enabling Auxiliary Channels Once a full two-port calibration is active, the auxiliary channels can be enabled. enable channel 3 or 4, press: 1. or 2. Once enabled, an auxiliary channel can be made active by pressing twice (for channel or twice (for channel 4). The active channel is indicated by an a...
Page 293 - Stimulus Functions; Defining Ranges with Stimulus Keys; When
Stimulus Functions S T I M U L U S Figure 6-5. Stimulus Function Block The stimulus function block keys are used to the source RF output signal to the test device by providing control of the following parameters: n swept frequency ranges n time domain start and stop times (Option 010 Only) n power s...
Page 294 - Stimulus Menu; Application and Operation
Stimulus Menu The (Menu) key provides access to the stimulus menu, which consists of that activate stimulus functions or provide access to additional menus. These are used to and control all stimulus functions other than start, stop, center, and span. The following are located within the stimulus me...
Page 295 - The Power Menu; Understanding the Power Ranges; Automatic mode
The Power Menu The power menu is used to and control analyzer power. It consists of the following softkeys: . . . . . . . . . . . . . n . . . . . . .../ . . . . . . . . . . . . ../......................./... . provides access to the power range menu. . compensates for power loss versus the frequency...
Page 296 - of sampler compression or noise floor.; Figure 6-6. Power Range Transitions in the Automatic Mode; Applisation and Operation Concepts
Note After measurement calibration, you can change the power within a range and still maintain nearly full accuracy. In some cases better accuracy can be achieved by changing the power within a range. It can be useful to set different power levels for calibration and measurement to minimize the effe...
Page 297 - Power Coupling Options; channel coupling; Channel coupling; forward direction; -16 Application and Operation Concepts
Power Coupling Options There are two methods you can use to couple and uncouple power levels with the HP 87533: n channel coupling n port coupling By uncoupling the primary channel powers, you effectively have two separate sources. Uncoupling the test ports allows you to have different power levels ...
Page 298 - Sweep Time; Manual Sweep Time Mode; cycle time; Application and Operation Concepts 6-17
Sweep Time selects sweep time as the active entry and shows whether the automatic or manual mode is active. The following explains the difference between automatic and manual sweep time: n sweep time. As long as the selected sweep speed is within the capability of the instrument, it will remain rega...
Page 299 - CW; time measurement with
n time domain (Option 010 Only) Use to determine the minimum cycle time for the listed measurement parameters. The values listed represent the minimum time required for a CW time measurement with averaging off. 6-1. Minimum Cycle Time (in seconds) Number of Points IF Bandwidth 3700 11 0.0025 0.0041 ...
Page 300 - Trigger Menu
Trigger Menu The trigger menu is used to select the type and number of groups for the sweep trigger. The following is a description of the located within this menu: freezes the data trace on the display, and the analyzer stops sweeping and taking data. The notation is displayed at the left of the gr...
Page 301 - Source Attenuator Switch Protection; Allowing Repetitive Switching of the Attenuator
Source Attenuator Switch Protection The programmable step attenuator of the source can be switched between port 1 and port 2 when the test port power is uncoupled, or between channel 1 and channel 2 when the channel power is uncoupled. avoid premature wear of the attenuator, measurement configuratio...
Page 302 - Channel Stimulus Coupling
Channel Stimulus Coupling . . . . . . . toggles the primary channel coupling of stimulus values. With (the preset condition), both primary channels have the same stimulus values. (The inactive primary channel and its auxiliary channel takes on the stimulus of the active primary channel.) In the stim...
Page 303 - Sweep Type Menu; and Operation Concepts
Sweep Type Menu The following are located within the sweep type menu. Among them are the five sweep types available. , . . . . . . . . . . menu The following sweep types will function with the interpolated error-correction feature (described later): n linear frequency n power sweep n following sweep...
Page 304 - segments; Segment Menu; Application and Operation Conccptc
Logarithmic Frequency Sweep (Hz) . . . . . The activates a logarithmic frequency sweep mode. The source is stepped in logarithmic increments and the data is displayed on a logarithmic graticule. This is slower than a continuous sweep with the same number points, and the entered sweep time may theref...
Page 306 - Swept Edit List Menu
Swept List Frequency Sweep (Hz) . . . frequency sweep modes. The swept list mode the analyzer to sweep a list of arbitrary frequency points which are defined and modified in a way similar to the stepped list mode. However, this mode takes data while through the frequency points, increasing throughpu...
Page 307 - Setting Segment IF Bandwidth
The power settings for all segments are restricted to a single power range. This prevents the attenuator from switching to different settings mid-sweep. Select the power range and then edit the list table to specify the segment powers. If the power range is selected after the list has been defined, ...
Page 309 - Response Functions
Response Functions Figure 6-7. Response Function Block The following response function block keys are used to and control the following functions of the n measurement parameters n data format n display functions . n reduction alternatives calibration functions n display markers The current values fo...
Page 310 - Understanding S-Parameters; Device
S-Parameters The key provides access to the S-parameter menu which contains that can be used to select the parameters or inputs that the type of measurement being performed. Understanding S-Parameters S-parameters (scattering parameters) are a convention used to characterize the way a device modifie...
Page 311 - Analog In Menu
S-parameters are exactly equivalent to the more common description terms below, requiring only that the measurements be taken with test device ports properly terminated. = 0 set Input reflection coefficient Forward Reverse gain Output reflection coefficient Direction FWDFWD REVREV The S-Parameter Me...
Page 312 - Figure 6-9. Reflection Impedance and Admittance Conversions; admittance using the model and equations shown in; Figure 6-10. Transmission Impedance and Admittance Conversions; conversions, as these formats are not easily interpreted.; Input; Ports Menu; for phase or
Figure 6-9. Reflection Impedance and Admittance Conversions In a transmission measurement, the data can be converted to its equivalent series impedance or admittance using the model and equations shown in 6-10. Note Figure 6-10. Transmission Impedance and Admittance Conversions Avoid the use of Smit...
Page 313 - The Format Menu; Log Magnitude Format; 3 2 Application and Operation Concepts
The Format Menu The key provides access to the format menu. This menu allows you to select the appropriate display format for the measured data. The following list identifies which formats are available by means of which softkeys: . . . . . . . . . . . . . . . . . . . . . . The analyzer automaticall...
Page 314 - Application and Operation Concepts 6-33
6-11. Log Magnitude Format Phase Format . . . . . . . . . . The displays a Cartesian format of the phase portion of the data, measured in degrees This format displays the phase shift versus frequency. Figure 6-12 illustrates the phase response of the same in a phase-only format. Figure 6-12. Phase F...
Page 315 - Smith Chart Format
Figure 6-13. Group Delay Format Smith Chart Format . . . . in reflection measurements to provide a readout of the data in terms of impedance. The intersecting dotted lines on the Smith chart represent constant resistance and constant reactance values, normalized to the characteristic impedance, of t...
Page 316 - Figure 6-14. Standard and Inverse Smith Chart Formats; scaled in a linear fashion, with the; Application and Operation Concepts 635
Figure 6-14. Standard and Inverse Smith Chart Formats corresponds to a particular value of both magnitude and phase. Quantities are read vectorally: the magnitude at any point is determined by its displacement from the center (which has zero value), and the phase by the angle counterclockwise from t...
Page 318 - Real Format; Format; displayed on the trace instead of impedance data.
Real Format The displays only the real (resistive) portion of the measured data on a Cartesian format (see Figure 6-18). This is similar to the linear magnitude format, but can show both positive and negative values. It is primarily used for analyzing responses in the time domain, and to display an ...
Page 319 - Group Delay Principles; the phase
Group Delay Principles For many networks, the amount of insertion phase is not as important as the linearity of the phase shift over a range of frequencies The analyzer can measure this linearity and express it in two different ways: directly, as deviation from linear phase, or as group delay, a der...
Page 320 - Figure 6-21. Rate of Phase Change Versus Frequency; aperture Af is increased (see; Figure 6-22. Variations in Frequency Aperture; noise will
result in the group delay data. These errors can be significant for long delay devices. You can verify that is by increasing the number of points or narrowing the frequency span (or both) until the group delay data no longer changes. a - - - i * 1 - - - - - Figure 6-21. Rate of Phase Change Versus F...
Page 322 - Scale Reference Menu; Electrical Delay; Appliwtion and Operation Concepts
Scale Reference Menu The key provides access to the scale reference menu. within this menu can be used to the scale in which measured data is to be displayed, as well as simulate phase offset and electrical delay. The following are located within the scale reference menu. Electrical Delay The adjust...
Page 323 - Display Menu; instrument; 4 2 Application and Operation Concepts
Display Menu The key provides access to the display menu, which enables auxiliary channels 3 and 4, controls the memory math functions, and leads to other menus associated with display functions. The analyzer has four available memory traces, one per channel. Memory traces are channel dependent: cha...
Page 324 - Dual Channel Mode; In; Channel Mode with Decoupled Stimulus
Dual Channel Mode With set to ON and set to the two traces are overlaid on a single graticule (see Figure . . . n With set to ON and set to or the measurement data is displayed on two half-screen graticules, one above the other, (see Figure Current parameters for the two displays are annotated separ...
Page 325 - and their primary channels.; 4 4 Application and Operation Concepts
Note Auxiliary channels 3 and 4 are permanently coupled by stimulus to primary channels 1 and 2 respectively. Decoupling the primary channels’ stimulus from each other does not affect the stimulus coupling between the auxiliary channels and their primary channels. 6 4 4 Application and Operation Con...
Page 327 - Channel Position; Displays; 46 Application and Operation Concepts
6-2. Customizing the Display Channel Position . . the display . . . . . . . . ... .. . . . . .. . . . . . . . . . . . . . . . . . . . .. . ....... .. . . .. . . . . . . . . . . . . n Channels 1 and 2 overlayed in the top graticule, and channels 3 and 4 are overlaid in the bottom graticule. n Channel...
Page 328 - Displays Menu
relationship between the keys and the channels. For example, beneath the four-grid display, [CHAN and are shown in yellow. Notice that in the four-grid graphic, Chl is yellow, indicating that the keys in yellow apply to channel 1. . . . . . . . . . . . . . . . . . . opens a screen which lists the an...
Page 329 - 4 6 Application and Operation Concepts
Memory Math Two trace math operations are implemented: and trace math is done immediately after error-correction. This means that any data processing done after error-correction, including parameter conversion, time domain transformation (Option scaling, etc, can be performed on the memory trace. Yo...
Page 330 - Colors; Application and Operation Concepts 6 4 6
Setting Default Colors To set all the display elements to the factory-defined default colors, press . . Note does not reset or change colors to the default color values. However, cycling power to the instrument will reset the colors to the default color values. Blanking the Display . . . ...) Pressi...
Page 331 - -3. Display Colors with Maximum Viewing Angle
To change the color of a display elements, press the for that element (such as en press and turn the analyzer front panel knob; use the step keys or the numeric keypad, until the desired color appears.If you change the text or background intensity to the point where the display is unreadable, you ca...
Page 332 - Averaging Menu; Averaging; Figure 6-25. Effect of Averaging on a Trace
Averaging Menu The key is used to access three different noise reduction techniques: sweep-to-sweep averaging, display smoothing, and variable IF bandwidth. All of these can be used simultaneously. Averaging and smoothing can be set independently for each channel, and the IF bandwidth can be set ind...
Page 333 - Smoothing; Figure 6-26. Effect of Smoothing on a Trace; IF Bandwidth Reduction
Smoothing Smoothing (similar to video averages the formatted active channel data over a portion of the displayed trace. Smoothing computes each displayed data point based on one sweep only, using a moving average of several adjacent data points for the current sweep. The smoothing aperture is a perc...
Page 334 - H i n t s; device using a booster amplifier.
Figure 6-27. IF Bandwidth Reduction H i n t s Another capability that can be used for effective noise reduction is the marker statistics function, which computes the average value of part or all of the formatted trace.If your instrument is equipped with Option 085 (High Power System), another way of...
Page 335 - Markers; on Trace; or below the range displayed on the graticule.
Markers The key displays a movable active marker on the screen and provides access to a series of menus to control up to five display markers for each channel. Markers are used to obtain numerical readings of measured values. They also provide capabilities for reducing measurement time by changing s...
Page 337 - Marker Function Menu; Marker Search; Menu; Marker Mode Menu
If the format is changed while a marker is on, the marker values become invalid. For example, if the value offset is set to 10 with a log magnitude format, and the format is then changed to phase, the value offset becomes 10 degrees. However, in polar and Smith chart formats, the specified values re...
Page 338 - Measurement Calibration; What Is Accuracy Enhancement?
Measurement Calibration Measurement calibration is an accuracy enhancement procedure that effectively removes the system errors that cause uncertainty in measuring a test device. It measures known standard devices, and uses the results of these measurements to characterize the system. This section d...
Page 339 - -56 Application and Operation Concepts
What Causes Measurement Errors? Network analysis measurement errors can be separated into systematic, random, and drift errors.Correctable systematic errors are the repeatable errors that the system can measure. These are errors due to mismatch and leakage in the test setup, isolation between the re...
Page 340 - Source Match; Load Match; be
directivity is independent of the characteristics of the test device and it usually produces the major ambiguity in measurements of low reflection devices. Source Match Source match is defined as the vector sum of signals appearing at the analyzer receiver input due to the impedance mismatch at the ...
Page 341 - performing; an isolation calibration you should use a
I Figure 6-31. Load Match The error contributed by load match is dependent on the relationship between the actual output impedance of the test device and the effective match of the return port (port 2). It is a factor in all transmission measurements and in reflection measurements of two-port device...
Page 342 - Characterizing Microwave Systematic Errors; Figure 6-32. Sources of Error in a Reflection Measurement; separating the incident; adapters between a; Application end Operation
Characterizing Microwave Systematic Errors One-Port Error Model In a measurement of the reflection coefficient (magnitude and phase) of a test device, the measured data differs from the actual, no matter how carefully the measurement is made. Directivity, source match, and reflection signal path fre...
Page 343 - and test
Figure 6-34. Effective Directivity Since the measurement system test port is never exactly the characteristic impedance (50 ohms), some of the reflected signal bounces off the test port, or other impedance transitions further down the line, and back to the unknown, adding to the original incident si...
Page 344 - Load”
F r e q u e n c y T r a c k i n g S F Figure 6-36. Reflection Tracking These three errors are mathematically related to the actual data, and measured data, by the following equation: (1 If the value of these three “E” errors and the measured test device response were known for each frequency, the ab...
Page 345 - Figure 6-38. Measured Effective Directivity; establish another condition (see; -64 Application and Operation Concepts
A c t u a l A f t e r = L o a d D i r e c t i v i t y Figure 6-38. Measured Effective Directivity Next, a short circuit termination whose response is known to a very high degree is used to establish another condition (see 6-39). = Figure 6-39. Short Circuit The open circuit gives the third independe...
Page 346 - This completes the calibration procedure for one port devices.
= Figure 6-40. Open Circuit This completes the calibration procedure for one port devices. Application and Operation Concepts
Page 348 - Sources of Error; transmitted signal (see; of test device
M E A S U R E M E N T U n k n o w n L Figure 6-42. Sources of Error The transmission coefficient is measured by taking the ratio of the incident signal (I) and the transmitted signal (see 6-43). Ideally, (I) consists only of power delivered by the source, and consists only of power emerging at the t...
Page 351 - Chapter 5, “Optimizing Measurement Results.
FORWARD I II I 1 I 1 I I RF IN l I I E E I L F S F I I I l I I I I I P O R T 1 P O R T 2 R E V E R S E I I I I l I I I I . l RF IN TR I I 1 I I I . XR I I Figure 6-46. Full Two-Port Error Model 6-47 shows the full two-port error model equations for all four S-parameters of a two-port device. Note th...
Page 352 - Model Equations; due to limitations of dynamic accuracy, test set; switch; uncertainties remain.
= Figure 6-47. Full Two-Port Model Equations In addition the errors removed by accuracy enhancement, other systematic errors exist due to limitations of dynamic accuracy, test set switch repeatability, and test cable stability. These, combined with random errors, also contribute to total system meas...
Page 353 - Calibration Considerations; Measurement Parameters
Calibration Considerations Measurement Parameters Calibration procedures are parameter-specific, rather than channel-specific When a parameter is selected, the instrument checks the available calibration data, and uses the data found for that parameter. For example, if a transmission response calibr...
Page 355 - Electrical Offset; be calculated with the formula:; Fringe Capacitance; transmission line. Refer to; -4. Calibration Standard Types and Expected Phase Shift
Electrical Offset Some standards have reference planes that are electrically offset from the mating plane of the test port. These devices will show a phase shift with respect to frequency. 6-4 shows which reference devices exhibit an electrical offset phase shift. The amount of phase shift can be ca...
Page 356 - mm Male; Female; -48. Typical Responses of Calibration Standards after
7 mm or Type-N Male Short (No Offset) Type-N Female, 3.5 mm Male or Female 7 mm or Type-N Male Type-N Female, 3.5 mm Male or Female Open 6-48. Typical Responses of Calibration Standards after Application and Operation Concepts 6-76
Page 357 - How Effective Is Accuracy Enhancement?; on Log Magnitude Format
How Effective Is Accuracy Enhancement? The uncorrected performance of the analyzer is sufficient for many measurements However, the vector accuracy enhancement procedures described in Chapter 5, Measurement Results, will provide a much higher level of accuracy. Figure 6-49 through Figure 6-51 illust...
Page 358 - on Smith Chart; calibration in Figure
Figure 6-50. Response versus S l-Port on Smith Chart 6-51 shows the response of a device in a log magnitude format, using a response calibration in Figure and a full two-port calibration in Figure Figure 6-51. Response versus Full Two-Port Calibration Application and Operation Concepts
Page 359 - Correcting for Measurement Errors; Ensuring a Valid Calibration
Correcting for Measurement Errors The key provides access to the correction menu which leads to a series of menus that implement the error-correction concepts described in this section. Accuracy enhancement (error-correction) is performed as a calibration step before you measure a test device. When ...
Page 361 - The Calibrate Menu; Response Calibration
The Calibrate Menu There are twelve different error terms for a two-port measurement that can be corrected by accuracy enhancement in the analyzer. These are directivity, source match, load match, isolation, reflection tracking, and transmission tracking, each in both the forward and reverse directi...
Page 362 - Two-Port Calibration; Calibration,” located later in this section.
Two-Port Calibration within the calibrate menu, provides the ability to make calibrations using the TRL or LRM method. For more information, refer to Calibration,” located later in this section. Application and Operation Concepts
Page 363 - The Select Cal Kit Menu
Restarting a Calibration If you interrupt a calibration to go to another menu, such as averaging, you can continue the Cal Kit Menu The kit menu provides access to a series of menus used to specify the characteristics of calibration standards. The following are located within the kit menu: The Selec...
Page 364 - Modifying Calibration Kits; Definitions
Modifying Calibration Kits Modifying calibration kits is necessary only if unusual standards (such as in are used or the very highest accuracy is required. Unless a calibration kit model is provided with the calibration devices used, a solid understanding of error-correction and the system error mod...
Page 365 - Modify Calibration Kit Menu; t h r u
4. Store the modified calibration kit.For a step by step procedure on how to modify calibration kits, refer to “Modifying Calibration Kit Standards” located in Chapter 5, Measurement Results. Modify Calibration Kit Menu . . menu. This leads in turn to additional series of menus associated with modif...
Page 368 - Specify Offset Menu; that
impedance (different from system ZO). . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . o h m s . defines the load as a (not sliding) load. . . . . . . . . . . . . . the load as a sliding load. When such a load is measured during ..................... calibration, the analyzer will pr...
Page 370 - Class Assignments; calibration requires three classes. A full; It is often
6-6. Class Assignments Calibration Kit Disk File Name: The number of standard classes required depends on the type of calibration being performed, and is identical to the number of error terms corrected. A response calibration requires only one class, and the standards for that class may include an ...
Page 372 - Verify performance
Label Class Menu The label class menus are used to meaningful labels for the calibration classes. These then become labels during a measurement calibration. Labels can be up to ten characters long. Label Kit Menu . . . . This within the modify kit menu, provides access to this menu. It is identical ...
Page 373 - Calibration; Why Use
Calibration The HP 8753E RF network analyzer has the capability of making calibrations using the “TRL” (thru-reflect-line) method. This section contains information on the following subjects: Why Use TRL Calibration? n TRL Terminology n How Calibration Works n Improving Raw Source Match and Load Mat...
Page 374 - Error Model; HP 8753E functional block diagram for a
How Calibration Works The calibration used in the HP 8753E relies on the characteristic impedance of simple transmission lines rather than on a set of discrete impedance standards. Since transmission lines are relatively easy to fabricate (in a microstrip, for example), the impedance of these lines ...
Page 375 - an isolation calibration is performed, the; error model and generalized
In total, ten measurements are made, resulting in ten independent equations. However, the TRL error model has only eight error terms to solve for. The characteristic impedance of the line standard becomes the measurement reference and, therefore, has to be assumed ideal (or known and defined precise...
Page 376 - Source match and load match
Source match and load match A TRL calibration a perfectly balanced test set architecture as shown by the term which represents both the forward source match and reverse load match and by the term which represents both the reverse source match and forward load match (E LF ). However, in any switching...
Page 377 - Application and
B I A S T E E B I A S T E E 1 0 1 0 A T T E N U A T O R F I X T U R E A T T E N U A T O R Figure 6-54. Typical Measurement Set up If the device measurement requires bias, it will be necessary to add external bias tees between the attenuators and the fixture. The internal bias tees of the analyzer wi...
Page 378 - Standards; insertion
The Calibration Procedure Requirements for Standards When building a set of TRL standards for a microstrip or fixture environment, the requirements for each of these standard types must be satisfied. Requirements THRU (Zero q No loss. Characteristic impedance need not be known. q 1 = 0 THRU (Non-zer...
Page 380 - was accounted for when using the
For microstrip and other fabricated standards, the velocity factor is significant. In those cases, the phase calculation must be divided by that factor. For example, if the dielectric constant for a substrate is 10, and the corresponding “effective” dielectric constant for microstrip is 6.5, then th...
Page 381 - options; Applicationand Operation Concepts
Another reason for showing this example is to point out the potential problem in calibrating at low frequencies using TRL. For example, one-quarter wavelength is Length (cm) = 7 5 0 0 x V F where: fc = center frequency Thus, at 50 MHz, Length (cm) 7 5 0 0 5 0 ( M H z ) = 150 cm 1.5 m Such a line sta...
Page 382 - Dispersion Effects
. .../ . . . . . . . . . is selected when the desired measurement impedance differs from the impedance of the line standard. This requires a knowledge of the exact value of the of the line. The system reference impedance is set using under the calibration menu. actual impedance of the line is set by...
Page 383 - Primary Applications; Applicationand
Power Meter Calibration associated with power meter calibration. An HP-IB-compatible power meter can monitor and correct RF source power to achieve leveled power at the test port. During a power meter calibration, the power meter samples the power at each measurement point across the frequency band ...
Page 384 - Loss of Power Meter Calibration Data; power; Interpolation in Power Meter Calibration
Loss of Power Meter Calibration Data The power meter calibration data will be lost by committing any of the following actions: Turning power off. off the instrument the power meter calibration table. sweep type. If the sweep type is changed (linear, log, list, CW, power) while power meter calibratio...
Page 385 - Setup for Continuous Sample Mode; connecting and; be as; accurate as the original calibration.
NETWORK ANALYZER POWER SENSOR Figure 6-55. Setup for Continuous Sample Mode Sample-and-Sweep Mode (One Sweep) the analyzer output power and update the power meter calibration data table during the initial measurement sweep. In this mode of operation, the analyzer does not require the power meter for...
Page 386 - Power; Loss Correction List; be lost if the instrument’s power is cycled.; Power Sensor Calibration
NETWORK ANALYZER POWER METER POWER SENSOR 0 C O N N E C T F O R I N I T I A L S W E E P 0 2 C O N N E C T F O R S U B S E Q U E N T S W E E P S Figure 6-56. Setup for Sample-and-Sweep Mode Power Loss Correction List If a directional coupler or power splitter is used to sample the RF power output of ...
Page 387 - of
The speed and accuracy of a power meter calibration vary depending on the test setup and the measurement parameters. For example, number of points, number of readings, if the power is less than -20 continuous versus sample and sweep mode. Accuracy is improved if you set the source power such that it...
Page 389 - Alternate and Chop Sweep Modes; Alternate; Chop; Sweeps Overlaid
Alternate and Chop Sweep Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . menu to activate either one or the other sweep modes. For information about sweep types, refer to “Sweep Type Menu,” located earlier in this chapter. Alternate unwanted signals, such as crosstalk from sampler ...
Page 391 - Using the Instrument State Functions; Figure 6-58. Instrument State Function Block; functions. The following keys are described in this chapter:
Using the Instrument State Functions R - L - - - T - - S - . . S T A T U S Figure 6-58. Instrument State Function Block The instrument state function block keys provide control of channel-independent system functions. The following keys are described in this chapter: n Limit lines and limit testing,...
Page 394 - system; Instrument; Using the Parallel Port
Most of the HP-IB addresses are set at the factory and need not be modified for normal system operation. The standard factory-set addresses for instruments that may be part of the system are as follows: Instrument BP-IB Address (decimal) Analyzer 16 Plotter 05 Printer 01 External Disk Drive 00 Contr...
Page 397 - Offset Limits Menu; 6 Application and Operation Concepts
Phase values can be specified between and Limit values above + and below are mapped into the range of to + to correspond with the range of phase data values. Offset Limits Menu This menu allows the complete limit set to be offset in either stimulus value or amplitude value. This is useful for changi...
Page 398 - Knowing the Instrument Modes; Network Analyzer Mode
Knowing the Instrument Modes There are five major instrument modes of the analyzer: network analyzer mode n external source mode n tuned receiver mode n frequency offset operation n harmonic mode operation (Option 002) Network Analyzer Mode This is the standard mode of operation for the analyzer, an...
Page 400 - CHANGED TO CW TIME MODE
n The frequency of the incoming signal should be within -0.5 to MHz of the selected frequency or the analyzer will not be able to phase lock to it. CW Frequency Range in External Source Mode. 300 to 3 (6 for Option 006) Compatible Sweep Types. The external source mode will only function in CW time s...
Page 403 - -122 Application and Operation Concepts
Receiver and Source Requirements. Refer to Chapter 7, “Specifications and Measurement Uncertainties. IF Input: R always; and port 1 or port 2 for a ratio measurement. Display Annotations. The analyzer shows the annotation of s when the frequency offset mode is on. The annotation of? indicates that t...
Page 404 - Test Setup; Setup; Single-Channel Operation; and see; entry; use
Harmonic Operation (Option 002 only) The harmonic measurement mode allows you to measure the second or third harmonic as the analyzer’s source sweeps fundamental frequencies above 16 MHz. The analyzer can make harmonic measurements in any sweep type. Test Setup NETWORK ANALYZER DEVICE UNDER TEST Fig...
Page 405 - -9. Maximum Fundamental Frequency using Harmonic Mode; and input power
Coupling Power Between Channels 1 and 2 the fundamental on channel 1 and the harmonic on channel 2. to ratios the two, showing the fundamental and the relative power of the measured harmonic in You must . . . . . . . . . . . . . . . . . . . . . . to to allow alternating sweeps. After uncoupling chan...
Page 406 - step mode; Application and Operation Concepts 6-125
Time Domain Operation (Option 010) With Option 010, the analyzer can transform frequency domain data to the time domain or time domain data to the frequency domain.In normal operation, the analyzer measures the characteristics of a test device as a function of frequency. Using a mathematical techniq...
Page 407 - General Theory
Time domain low pass impulse mode simulates the time domain response of an impulse input (like the mode). Both low pass modes yield better time domain resolution for a given frequency span than does the mode. In addition, when using the low pass modes, you can determine the type of discontinuity. Ho...
Page 409 - Figure 6-63. A Reflection Measurement of Two Cables; The ripples in reflection; versus frequency in the frequency domain measurement are; reflection; Interpreting the; axis. The quantity displayed on the
NETWORK ANALYZER ADAPTER LOAD I Figure 6-63. A Reflection Measurement of Two Cables The ripples in reflection coefficient versus frequency in the frequency domain measurement are caused by the reflections at each connector “beating” against each other. One at a time, loosen the connectors at each en...
Page 411 - domain low; pass; -11. Minimum Frequency Ranges for Time Domain Low Pass
Time domain low pass This mode is used to simulate a traditional time domain reflectometry (TDR) measurement. It provides information to determine the type of discontinuity (resistive, capacitive, or inductive) that is present. Low pass provides the best resolution for a given bandwidth in the frequ...
Page 413 - Step and Impulse Response Waveforms (Real Format); with the real format.
E L E M E N T S T E P R E S P O N S E I M P U L S E R E S P O N S E O P E N U N I T Y R E F L E C T I O N U N I T Y R E F L E C T I O N S H O R T R E F L E C T I O N , - 1 8 0 ” U N I T Y R E F L E C T I O N , R E S I S T O R R P O S I T I V E L E V E L S H I F T A P O S I T I V E P E A K R E S I S ...
Page 414 - Step Measurements of Common Cable Faults (Real Format); Transmission Measurements In Time Domain Low Pass; Measuring small signal transient response using low pass step.; Use the low pass mode to
G 1 ' - 4 . 8 3 2 I I I I 5 1: 2 . 9 2 0 7 3 M A R K E R 1 CTAPT 1 0 Figure 6-67. Low Step Measurements of Common Cable Faults (Real Format) Transmission Measurements In Time Domain Low Pass Measuring small signal transient response using low pass step. Use the low pass mode to analyze the test devi...
Page 416 - THRU LINE; Figure 6-69. Transmission Measurements Using Low; Time Domain Concepts
(a) Comparing Transmission (b) Measuring Pulse Dispersion Paths through a Power Divider on a 1.5 km Fiber Optic Cable THRU LINE FIBER OPTIC CABLE Figure 6-69. Transmission Measurements Using Low Impulse Mode Time Domain Concepts Masking occurs when a discontinuity (fault) closest to the reference pl...
Page 417 - Windowing
(a) Short Circuit Short Circuit at the End of a 3 Pad Windowing Figure 6-70. Masking Example The analyzer provides a windowing feature that makes time domain measurements more useful for isolating and identifying individual responses Windowing is needed because of the abrupt transitions in a frequen...
Page 418 - Level, and Windowing Values
select a window, press A menu is presented that allows the selection of three window types (see 6-12). 6-12. Impulse Width, Level, and Windowing Values Window Level Width (50%) Level (10 90%) Minimum Span -21 Span Normal Span -60 Span -75 Span -70 1 Span NOTE: The mode simulates an impulse impulse w...
Page 419 - points, rather than continuously over the frequency band.
LOW PASS IMPULSE Figure 6-72. The Effects of Windowing on the Time Domain Responses of a Short Circuit In the time domain, range is defined as the length in time that a measurement can be made without encountering a repetition of the response, called aliasing. A time domain response repeats at regul...
Page 420 - Resolution; Response resolution.
To increase the time domain measurement range, increase the number of points, but remember that as the number of points increases, the sweep speed decreases. Decreasing the frequency span also increases range, but reduces resolution. Resolution Two different resolution terms are used in the time dom...
Page 421 - test device bandwidth to achieve better resolution.; Figure 6-74. Range Resolution of a Single Discontinuity
S T A R T 5 7 0 S T O P 2 . 5 0 5 Figure 6-73. Response Resolution While increasing the frequency span increases the response resolution, keep the following points in mind: The time domain response noise floor is directly related to the frequency domain data noise floor. Because of this, if the freq...
Page 422 - Figure 6-75. Sequence of Steps in Gating Operation
Gating Gating provides the flexibility of selectively removing time domain responses. The remaining time domain responses can then be transformed back to the frequency domain. For reflection (or fault location) measurements, use this feature to remove the effects of unwanted discontinuities in the t...
Page 423 - Selecting gate shape.; Transforming CW Time Measurements Into the Frequency Domain
C H I A / R MAG REF S T O P 7 Figure 6-76. Gate Shape Selecting gate shape. The four gate shapes available are listed in 6-13. Each gate has a different flatness, cutoff rate, and levels. 6-13. Gate Characteristics Gate Gate Span Minimum Wide Maximum Ripple l 0.01 Levels -68 -57 -70 Span Span Span S...
Page 425 - Figure 6-78. Combined Effects of Amplitude and Phase Modulation; to control the demodulation feature:
Figure 6-78. Combined Effects of Amplitude and Phase Modulation Using the demodulation capabilities of the analyzer, it is possible to view the amplitude or the phase component of the modulation separately. The window menu includes the following to control the demodulation feature: ii . . . . . . . ...
Page 426 - Forward transform
Forward transform range. In the forward transform (from CW time to the frequency domain), range is as the frequency span that can be displayed before occurs, and is to range as defined for time domain measurements. In the range formula, substitute time span for frequency span.Example: R a n g e = Nu...
Page 428 - Application and Operation Conoepts
Commands That Require a Clean Sweep Many front panel commands disrupt the sweep in progress. For example, changing the channel or measurement type. When the analyzer does execute a disruptive command in a sequence, some instrument functions are inhibited until a complete sweep is taken. This applies...
Page 429 - for Controlling Peripherals; you; Applicationmd Operation
The Sequencing Menu Pressing the key accesses the Sequencing menu. This menu leads to a series of menus that you to create and control sequences, Sequence Command The located in the Sequencing menu, activates a feature that allows :: the sequence to branch off to another sequence, then return to the...
Page 432 - Loop counter decision making; Considerations; and Operation Consepts 6-161
Loop counter decision making The analyzer has a numeric register called a loop counter. The value of this register can be set by a sequence, and it can be incremented or decremented each time a sequence repeats itself. . to another sequence if the stated condition is true. When entered into the sequ...
Page 433 - Special Commands; Sequences Using HP-IB
menu) sends the HP-GL command string to the analyzer’s HP-GL address. The address of the analyzer’s HP-GL graphics interface is always offset from the instrument’s HP-IB address by 1: n If the current instrument address is an even number: HP-GL address = instrument address + 1. n If the current inst...
Page 434 - Amplifier; Amplifier parameters; third harmonic as shown in
Amplifier Amplifier parameters The HP 8753E allows you to measure the transmission and reflection characteristics of many amplifiers and active devices. You can measure scalar parameters such as gain, gain flatness, gain compression, reverse isolation, return loss (SWR), and gain drift versus time. ...
Page 435 - Gain Compression
The second/third harmonic response can be displayed directly in or below the fundamental or carrier (see 6-84). The ability to display harmonic level versus frequency or RF power allows “real-time” tuning of harmonic distortion. this swept harmonic measurement, as well as of the traditional linear a...
Page 436 - second harmonic power as a function of input power.; up to 3
Figure 6-85. Diagram of Gain Compression Figure 6-86 illustrates a simultaneous measurement of fundamental gain compression and second harmonic power as a function of input power. REF 10 G A I N I I I I I I 1 S T A R T - 5 . 0 c w 2 0 0 . 0 0 0 0 0 0 STOP 1 0 . 0 N A G R E F - 3 0 I I I I I I I STAR...
Page 437 - Metering the power level; Configuration for Setting
Metering the power level When you are measuring a device that is very sensitive to absolute power level, it is important that you accurately set the power level at either the device input or output. The analyzer is capable of using an external HP-IB power meter and controlling source power directly....
Page 438 - Mixer Testing; Frequency Offset
Mixer Testing Mixers or frequency converters, by definition, exhibit the characteristic of having different input and output frequencies. Mixer tests can be performed using the frequency offset operation of the analyzer (with an external LO source) or using the tuned receiver operation of the analyz...
Page 439 - -168 Application and Operation Concepts
Mixer Parameters You Can Measure Figure 6-88. Mixer Transmission characteristics include conversion loss, conversion compression, group delay, and RF feedthru. n Reflection characteristics include return loss, and complex impedance. n Characteristics of the signal at the output port include the outp...
Page 440 - Attenuation at Mixer Ports; corrected for and will add to overall measurement uncertainty.; Conversion Loss versus Output Frequency Without Attenuators at; the analyzer’s R channel port is less than -10
Attenuation at Mixer Ports Mismatch between the instruments, cables, and mixer introduces errors in the measurement that you cannot remove with a frequency response calibration. You can reduce the mismatch by using high quality attenuators as close to the mixer under test as possible. When character...
Page 441 - IF Signal Path Filtering
Harmonics, linearity, and spurious signals also introduce errors that are not removed by frequency response calibration. These errors are smaller with a narrowband detection scheme, but they may still interfere with your measurements. You should the IF signal to reduce these errors as much as possib...
Page 442 - Selection; LO Frequency Accuracy and Stability; Examples
Selection By choosing test frequencies (frequency list mode), you can reduce the effect of spurious responses on measurements by avoiding frequencies that produce IF signal path distortion. LO Frequency Accuracy and Stability The analyzer source is phaselocked to its receiver through a reference loo...
Page 443 - In a down converter measurement where the; Figure 6-93. Down Converter Port Connections
It is important to keep in mind that in the setup diagrams of the frequency offset mode, the analyzer’s source and receiver ports are labeled according to the mixer port that they are connected to. n In a down converter measurement where the is selected, the notation on the analyzer’s setup diagram ...
Page 444 - Figure 6-94. Up Converter Port Connections
n on the setup diagram indicates that the analyzer’s source frequency is labeled IF, connecting to the mixer IF port, and the analyzer’s receiver frequency is labeled RF, connecting to the mixer RF port.Because the RF frequency can be greater or less the set LO frequency in this type of . . . . meas...
Page 445 - Conversion Loss; Conversion loss is a measure of how; Isolation
Conversion Loss F= RF F= FREQUENCY Figure 6-95. Example Spectrum of RF, LO, and IF Signals Present in a Conversion Loss Measurement Conversion loss is a measure of how a mixer converts energy from one frequency to another. It is the ratio of the sideband output power to input signal power and is usu...
Page 446 - Return Loss; Application and Operation Concepts 6-165
RF RF feedthru, or RF-to-IF isolation, is the amount the RF power that is attenuated when it reaches the IF port. This value is low in double balanced mixers. RF feedthru is usually less of a problem than the LO isolation terms because the LO power level is significantly higher than the RF power dri...
Page 447 - Conversion Compression; Figure 6-97. Conversion Loss and Output Power as a Function; Phase Measurements
Conversion Compression S i g n a l ( R F ) I n p u t S i g n a l ( R F ) Figure 6-97. Conversion Loss and Output Power as a Function of Input Power Level Conversion compression is a measure of the RF input signal level for which the mixer will provide linear operation. The conversion loss is the rat...
Page 448 - place as the reference mixer.; Phase Linearity and Group Delay; and deviation; group; delay are both measurements of the; of a transmitted
Amplitude and Phase Tracking The match between mixers is defined as the absolute difference in amplitude and/or phase response over a specified frequency range. The tracking between mixers is essentially how well the devices are matched over a specified interval. This interval may be a frequency int...
Page 450 - Connection Considerations; Adapter
Connection Considerations Adapters minimize the error introduced when you add an adapter to a measurement system, the adapter needs to have low SWR or mismatch, low loss, and high repeatability. Worst Case System 14 Leakage signals Reflected signal * Coupler has Directivity . Adapter __ . . . . . . ...
Page 451 - Fixtures; If You
Fixtures Fixtures are needed to interface non-coaxial devices to coaxial test instruments. It may also be necessary to transform the characteristic impedance from standard 50 ohm instruments to a non-standard impedance and to apply bias if an active device is being measured.For accurate measurements...
Page 452 - Reference Documents; General Measurement and Calibration Techniques
Reference Documents Hewlett-Packard Company, “Simplify Your Amplifier and Mixer Testing” 5056-4363 Hewlett-Packard Company, “RF and Microwave Device Test for the Seminar Papers” Hewlett-Packard Company Amplifiers and Active Devices with the HP 8720 Network Analyzer” Product Note 5091-1942E Hewlett-P...
Page 453 - On-Wafer Measurements; January; -172 Application and Operation
On-Wafer Measurements Hewlett-Packard Company, “On-Wafer Measurements Using the HP 8510 Network Analyzer andCascade Microtech Wafer Probes,” Product Note 8510-6 HP publication number Barr, J.T., T. Burcham, A.C. Davidson, E. W. Strid, “Advancements in On-Wafer Probing Calibration Techniques, Hewlett...
Page 454 - Dynamic Range; Speoifisations and Measurement
Dynamic Range The described in the table below apply to transmission measurements using 10 Hz IF BW and full correction. Dynamic range is limited by the maximum test port and the receiver’s noise floor. 7-1. H P 8753E Dynamic Speoifisations and Measurement
Page 455 - HP 8753E Measurement Port Specifications; analyzer. The system hardware includes the following:; with
HP 8753E Measurement Port Specifications HP 8763E with Ports The following specifications describe the system performance of the HP 8753E network analyzer. The system hardware includes the following: options: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ....
Page 457 - Port
HP with Type-N Ports The following specifications describe the system performance of the HP 8753E network analyzer. The system hardware includes the following: options: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ....
Page 458 - Ports
HP 8763E W with Ports following specifications describe the system performance of the HP 8753E network analyzer. The system hardware includes the following: Options: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...
Page 463 - 753E Instrument Specifications (1 of 6)
Page 465 - and Measurement Uncertainties
7-12. HP 8753E Instrument (3 of 6) Characteristics Magnitude and and Measurement Uncertainties
Page 466 - Specifications and Measurement Uncertainties 7-13
7-12. HP 8753E Instrument (4 of 6) 10 0 -10 -20 -30 -40 -50 -60 -70 - 8 0 - 9 0 0 -100 Specifications and Measurement Uncertainties 7-13
Page 468 - Group Delay Accuracy vs. Aperture
7-12. 8753E Instrument (6 of 6) 100 Group Delay Accuracy vs. Aperture Specifications and Measurement Uncertainties
Page 469 - Measurement Throughput Summary
HP Network Analyzer General Characteristics Measurement Throughput Summary The following table shows typical measurement times for the HP 8753E network analyzer inmilliseconds. T 1 Specifications and Measurement Uncertainties
Page 470 - Specificctionr and Measurement
Remote Programming Interface HP-IB interface operates according to IEEE 488-1978 and IEC 625 standards and IEEE 728-1982 recommended practices Transfer Formats Binary (internal floating point complex format) ASCII bit IEEE 754 Floating Point Format Interface Function Codes Ml, TEO, LEO, PPO, Cl, Fro...
Page 473 - of calibration temperature; Non-Operating Storage Conditions
Environmental Characteristics General Conditions EMC characteristics: emissions, CISPR Publication 11; immunity, IEC level 2. Electrostatic discharge (ESD): must be eliminated by use of static-safe work procedures and an anti-static bench mat (such as HP Dust: the environment should be as dust-free ...
Page 474 - Physical Dimensions; Internal Memory; Temperature at 70; Specifications and Measurement
Weight Net . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 (46 lb) shipping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 kg (76 lb) Cabinet Dimension...
Page 476 - Menu Maps
Page 490 - Guide; Key Definitions
This chapter contains information on the following topics: and front-panel functions in alphabetical order (includes a brief description of each function) cross reference of programming commands to key functions n cross reference of to front-panel access keys Note . . can be found in the HP 8753E Ne...
Page 493 - 4 Key Definitions
calculates and displays the complex ratio of the signal at input A to the reference signal at input R. puts the name of the active entry in the display title. puts the active marker magnitude in the display title. selects coaxial as the type of port used in adapter removalcalibration. selects wavegu...
Page 496 - Key Dsfinitions
brings up the segment modify menu and segment edit(calibration factor menu) which allows you to enter a power sensor’s calibration factors The calibration factor data entered in this menu will be stored for power sensor B. leads to the select cal kit menu, which is used to select one of the default ...
Page 507 - Key Definitions
(Option 010 only) selects an intermediate time domain gate. copies the sequence titles currently in memory into the six positions. calls sub-routines in sequencing. specifies whether or not to store display graphics on disk with the instrument state. brings up the graticule print color menu. The gra...
Page 536 - ANOTHER SYSTEM CONTROLLER ON
is the mode used when peripheral devices are to be used and there is no external controller. In this mode, the analyzer can directly control peripherals (plotter, printer, disk drive, or power meter). System controller mode must be set in order for the analyzer to access peripherals from the front p...
Page 543 - Cross Reference of Key Function to Programming Command; to Programming
Cross Reference of Key Function to Programming Command The following table lists the front-panel keys and alphabetically. The “Command” column identifies the command that is similar to the front-panel or function. that do not have corresponding programming commands are not included in this section. ...
Page 547 - Name
9-1. Cross Reference of Key Function to Programming command (continued) Name Decrement Loop Counter DECRLOOC Default Colors DEFC Default Plot Setup Default Print Setup DEFLPRINT Standard Delay Delete Delete All Files Delta Limits Demodulation Amplitude Demodulation Off Demodulation Phase Directory S...
Page 553 - K e y
9-1. Cross Reference of Key Function to Programming Command (continued) Name Offset Delay Offset Loads Done Offset Loss Offset Impedance Omit Isolation One-Path X-Port Calibrate One Sweep Listing of Operating Parameters Power Meter HPIB to Title Parallel in Bit Number Parallel in IF Bit H Parallel i...
Page 554 - Cross Reference of Key Function to Programming Co
Cross Reference of Key Function to Programming Co (continued) Plot name Plot Plot Speed Fast Plot Speed Slow Plot Text On Plot Text off Plotter Baud Rate Plotter Form Feed Plotter Port Disk Plotter Port HPIB Plotter Port Parallel Plotter Port Serial Plot to a Plotter Plot to a Compatible Printer Pol...
Page 560 - Cross Reference of Key Function to Programming
9-1. Cross Reference of Key Function to Programming (continued) . . . . . .. . ... Sloping Line LIMTSL Smith Chart Smoothing Aperture SMOOAPER Smoothing On SMOOON Smoothing Off SMOOOFF Source Power On Source Power Off Specify Gate SPEG One-Graticule Display Two-Graticule Display Four-Graticule Displ...
Page 564 - Locations; The following table lists the
Locations The following table lists the functions alphabetically, and the corresponding front-panel access key. This table is useful in determining which front-panel key leads to a specific Key Definitions
Page 570 - Access Key
9-2. Locations (continued) Access Key Key Definitions
Page 573 - A c c e s s
9-2. Locations (continued) Front-Panel A c c e s s K e y Definitions
Page 578 - Key Definitiins
Page 585 - Error Messages
1 0 Error Messages This chapter contains the following information to help you interpret any error messages thatmay be displayed on the analyzer LCD or transmitted by the instrument over HP-IB: n An alphabetical listing of error messages, including: q An explanation of the message q Suggestions to h...
Page 586 - Error Messages in Alphabetical Order
Error Messages in Alphabetical Order CAL REQUIRED FOR AUX CHANNEL USE 217 calibration being active. Perform (or recall) a full calibration and . . . . . . . .. . . . . . . . . auxiliary channel. ABORTING COPY OUTPUT Information This message is displayed briefly if you have pressed to abort a copy Me...
Page 587 - not
ANALOG BUS DISABLED IN IF BW Error Number When you the not 212 available for use in troubleshooting. For a description of the analog bus, refer to the HP Guide. ANOTHER SYSTEM CONTROLLER ON HP-IB BUS Error Number You must remove the active controller from the bus or the controller must 3 7 relinquis...
Page 589 - and Command; Error Messages 1
BLOCK Error Number The length of the header received by the analyzer did not agree with the size 35 of the internal array block. Refer to the HP 8753E Network and Command for instructions on using analyzer input commands. CALIBRATION ABORTED Error Number You have changed the active during a calibrat...
Page 591 - E r r o r l e s s a g e s
CORRECTION AND DOMAIN RESET Error Number When you change the frequency range, sweep type, or number of points, 65 error-correction is switched off and the time domain transform is recalculated, without error-correction. You can either correct the frequency range, sweep type, or number of points to m...
Page 597 - E r r o r
Information When list IF bandwidth has been enabled and swept list mode Message not be able to change the IF bandwidth using the key. To change the bandwidth, edit the swept list table. Error Number The disk unit or volume number set in the analyzer is not Refer to the 46 disk drive operating manual...
Page 602 - Network
Error Number See error number 57. 5 9 Error Number You have exceeded approximately + 14 at one of the test ports. The RF 57 output power is automatically reduced to -85 The annotation appears in the left margin of the display to indicate that the power trip function has been activated. When this occ...
Page 612 - Error Messages in Numerical Order; PRINT ABORTED
Error Messages in Numerical Order Refer to the alphabetical listing for explanations and suggestions for solving the problems. Some error numbers have been omitted due to obsoleted error messages. 2 5 PRINT ABORTED 2 6 not on, not connect, wrong addrs 1 Error Messages
Page 618 - Compatible Peripherals; Calibration Kits; Compatible Peripherals 1
1 1 Compatible Peripherals This chapter contains the following information: n Measurement accessories available n System accessories available n Connecting and peripherals HP-IB programming overview Where to Look for More Information Additional information about many of the topics discussed in this ...
Page 620 - Transistor Test Fixtures; Power Limiters
Transistor Test Fixtures The following Hewlett-Packard transistor test are compatible with the HP 8753E. Additional test fixtures for transistors and other devices are from Inter-Continental Microwave. order their catalog, request HP literature number 5091-4254E. contactInter-Continental Microwave a...
Page 621 - System Accessories Available; System Cabinet; Plotters and Printers; 14 Compatible Peripherals
System Accessories Available System Cabinet The HP system cabinet is designed to rack mount the analyzer in a system configuration. The 132 cm (52 in) system cabinet includes a bookcase, a drawer, and aconvenient work surface. System The HP system testmobile is designed to provide mobility for instr...
Page 624 - External Monitors; Monitor Requirements:; Compatible Peripherals 11-7
Controller An external controller is not required for measurement calibration or time domain capability.However, some performance test procedures are semi-automated and require the use of an external controller. (The system verification procedure does not require an external controller.) The system ...
Page 625 - Connecting Peripherals; Connecting the Peripheral Device; Connect the peripheral to the corresponding interface port.
Connecting Peripherals Connecting the Peripheral Device Connect the peripheral to the corresponding interface port. Figure Peripheral Connections to the Analyzer Note The keyboard can be connected to the analyzer while the power is on or off.
Page 626 - the Analyzer for the Peripheral; If the Peripheral is a Printer
the Analyzer for the Peripheral All copy configuration settings are stored in non-volatile memory. Therefore, they are notaffected if you press or switch off the analyzer power. If the Peripheral is a Printer . . . . . . . . . . . . . . . appears: q (except for HP DeskJet 540 and DeskJet (printers t...
Page 629 - control the
2. Configure the analyzer for one of the following plotter interfaces: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . plot function as follows: a. Enter the HP-IB address of the printer (default is followed by . . . the HP-IB bus. . c. Press and if there is an external controller conn...
Page 631 - Configuring the Analyzer to Produce a Time Stamp
Configuring the Analyzer to Produce a Time Stamp You can set a clock, and then activate it, if you want the time and date to appear on hardcopies. . . . year, by and enter the current month of the year, followed (xl). . . . Press and enter the current day of the month, followed by (xl. Press and ent...
Page 632 - HP-IB Programming Overview
HP-IB Programming Overview The analyzer is factory-equipped with a remote programming digital interface using the Hewlett-Packard Interface Bus (HP-IB). HP-IB is Hewlett-Packard’s hardware, software, documentation, and support for IEEE 488.1 and worldwide standards for interfacing instruments. The H...
Page 634 - Data; Bus; transferred over HP-IB undergoes a handshake to insure valid data.; Control Lines; to send bus commands.
A b l e t o t a l k DEVICE D A b l e t o t a l k o n l y I D A T A ( 8 s i g n a l l i n e s ) , H A N D S H A K E L I N E S Figure 11-2. HP-IB Bus Structure Data Bus The data bus consists of 8 bidirectional lines that are used to transfer data from one device to another. Programming commands and da...
Page 639 - Analyzer Command Syntax
There is also an address for the system controller. This address refers to the controller when the network analyzer is being used in pass-control mode. This is the address that control is passed back to when the analyzer-controlled operation is complete. Analyzer Command Syntax The analyzer HP-IB co...
Page 642 - Preset State and Memory Allocation; make
1 2 Preset State and Memory Allocation The analyzer is capable of saving complete instrument states for later retrieval. It can store these instrument states into the internal memory, to the internal disk, or to an external disk. This chapter describes these capabilities in the following sections: n...
Page 643 - 2-2 Preeet State and Memory Allocation
This is CMOS read/write memory that is protected by a battery to provide storage of data when line power to the instrument is turned off. With this battery protection, data can be retained in memory for days at C and for years at C (characteristically). Non-volatile memory consists of a block of use...
Page 644 - Memory Requirements of Calibration and Memory Trace Arrays
12-1 shows the memory requirements of calibration arrays and memory trace arrays to help you approximate memory requirements. For example, add the following memory requirements: n a full calibration with 801 points (58 k) n the memory trace array (4.9 k) n the instrument state (approximately 6 k) Th...
Page 645 - 2 4 Preset State and Memory Allocation
You can use the internal disk drive or connect an external disk drive for storage of instrument states, calibration data, measurement data, and plot (Refer to Chapter 4, “Printing, Plotting, and Saving Measurement Results”, for more information on saving measurement data and plot The analyzer displa...
Page 646 - Character Definitions; as the one stored for the instrument state.; Preset; State; and Memory Allocation 1 2 4
I, P, Instrument Four-channel instrument state G Graphics 1 Display graphics 0 index D Error corrected data 1 Channel 1 2 Channel 2a Channel 3 4 Channel 4 Raw data 1 to 4 Channel 113, raw arrays 1 5 to 8 Channel raw arrays 6 to 8 Formatted data 1 Channel 1 2 Channel 28 Channel 3 4 Channel 4 CalCal d...
Page 648 - Preset State
Preset State When the key is pressed, the analyzer reverts to a known state called the factory preset state. This state is defined in 12-3. There are subtle differences between the preset state and the power-up state. These differences are documented in 12-4. If power to non-volatile memory is lost,...
Page 651 - Allocation
12-3. Preset Conditions (3 of 5) Preset Conditions Copy Parallel Port Plotter Type Plotter Port Plotter Baud Rate Plotter Handshake HP-IB Address Printer Type Printer Port Printer Baud Rate Printer Handshake Printer HP-IB Address Disk Save Store) Data Array Data Array Data Array Size Using Select Di...
Page 653 - 2-12 Preset State and Memory Allocation
12-5. Results of Power Loss to Non-Volatile Memory HP-IB ADDRESSES are set to the following defaults: HP 8753E. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 USER DISPLAY . . . . . . . ...
Page 654 - The CITIfile Data Format and Keyword Reference
The CITIfile Data Format and Keyword Reference This appendix contains the following information: n The Data Format q Description and Overview q Definition Of Terms q CITIfile Examples n The Keyword Reference. The Data Format CITIfile is a standardized data format, used for exchanging data between di...
Page 656 - Keyword
Keyword Keywords are always the word on a new line. They are always one continuous word without embedded spaces.A listing of the keywords used in the latest version of is shown in “The Keyword Reference. When reading a unrecognized keywords should be ignored. This allows new keywords to be added, wi...
Page 658 - Example 4 shows how
Example Frequency List Cal Set Example 4 shows how may be used to store instrument setup information. In the case of an 8510 Set, a limited instrument state is needed in order to return the instrument to the same state that it was in when the calibration was done. Three arrays of error correction da...
Page 662 - uncertainty; Sources of Measurement Errors; Determining System Measurement Uncertainties
Determining System Measurement Uncertainties In any measurement, certain measurement errors associated with the system add uncertainty to the measured results This uncertainty how accurately a device under test can be measured.Network analysis measurement errors can be separated two types: raw and r...
Page 664 - Measurement Uncertainty Equations; Determining
Two additional categories of measurement errors are connection techniques and contact surfaces. The connection techniques category includes torque limits, flush setting of sliding load center conductors, and handling procedures for airlines. The contact surfaces category includes procedures, scratch...
Page 665 - Reflection Phase Uncertainty
where Efnt = effective noise on trace Efnf = effective noise floor n Crtl = connector repeatability (transmission) n = connector repeatability (reflection) n Ctml = cable 1 transmission magnitude stability n = cable 1 reflection magnitude stability = cable 2 reflection magnitude stability n Dmsl = d...
Page 666 - Transmission Magnitude Uncertainty; Determining System Measurement
Transmission Magnitude Uncertainty An analysis of the error model, located at the end of this appendix, yields an equation for the transmission magnitude uncertainty. The equation contains of the order terms and some of the significant second order terms. The terms under the radical are random in ch...
Page 668 - Determining Expected System Performance; Noise Floor and Crosstalk.
Determining Expected System Performance Use the uncertainty equations, dynamic accuracy calculations in this appendix, and tables of system performance values from the “Specifications and Measurement Uncertainties” chapter in the to calculate the expected system performance. The following pages expl...
Page 670 - Measurement Uncertainty Worksheet (1 of 3); Determining System Measurement Uncertainties B-g
Measurement Uncertainty Worksheet (1 of 3) Error Symbol Linear Directivity Reflection Tracking Err Source Match Match Tracking Effective Dynamic Accuracy Noise Floor High Level Noise Connector Reflection Repeatability Port 1 Connector Transmission Repeatability Port 1 Magnitude Drift Due ‘lkmperatur...