Cypress CY62167EV18 - Manual

Cypress CY62167EV18

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Table of Contents:

  • Page 2 – NC; Notes
  • Page 3 – Electrical Characteristics
  • Page 4 – CE
  • Page 5 – Switching Characteristics
  • Page 6 – Switching Waveforms; Figure 4
  • Page 8 – HZWE
  • Page 9 – Figure 9; Truth Table
  • Page 10 – Ordering Information; Industrial; Package Diagram
  • Page 12 – Document History Page; Change
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CY62167EV18 MoBL

®

16 Mbit (1M x 16) Static RAM

Cypress Semiconductor Corporation

198 Champion Court

San Jose

,

CA 95134-1709

408-943-2600

Document #: 38-05447 Rev. *G

Revised March 13, 2009

Features

Very high speed: 55 ns

Wide voltage range: 1.65V to 2.25V

Ultra low standby power

Typical standby current: 1.5

μ

A

Maximum standby current: 12

μ

A

Ultra low active power

Typical active current: 2.2 mA at f = 1 MHz

Easy memory expansion with CE

1

, CE

2

, and OE features

Automatic power down when deselected

CMOS for optimum speed and power

Offered in Pb-free 48-ball VFBGA packages

Functional Description

The CY62167EV18 is a high performance CMOS static RAM

organized as 1M words by 16 bits. This device features

advanced circuit design to provide ultra low active current. This

is ideal for providing More Battery Life

(MoBL

®

) in portable

applications such as cellular telephones. The device also has an

automatic power down feature that reduces power consumption

by 99 percent when addresses are not toggling. Place the device

into standby mode when deselected (CE

1

HIGH or CE

2

LOW or

both BHE and BLE are HIGH). The input and output pins (I/O

0

through I/O

15

) are placed in a high impedance state when: the

device is deselected (CE

1

HIGH or CE

2

LOW); outputs are

disabled (OE HIGH); both Byte High Enable and Byte Low

Enable are disabled (BHE, BLE HIGH); and a write operation is

in progress (CE

1

LOW, CE

2

HIGH and WE LOW).

To write to the device, take Chip Enables (CE

1

LOW and CE

2

HIGH) and Write Enable (WE) input LOW. If Byte Low Enable

(BLE) is LOW, then data from I/O pins (I/O

0

through I/O

7

) is

written into the location specified on the address pins (A

0

through

A

19

). If Byte High Enable (BHE) is LOW, then data from I/O pins

(I/O

8

through I/O

15

) is written into the location specified on the

address pins (A

0

through A

19

).

To read from the device, take Chip Enables (CE

1

LOW and CE

2

HIGH) and Output Enable (OE) LOW while forcing the Write

Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW, then data

from the memory location specified by the address pins appears

on I/O

0

to I/O

7

. If Byte High Enable (BHE) is LOW, then data from

memory appears on I/O

8

to I/O

15

. See the

Truth Table on page

9

for a complete description of read and write modes.

For best practice recommendations, refer to the Cypress

application note

AN1064, SRAM System Guidelines

.

Power Down

Circuit

BHE
BLE

CE

2

CE

1

1M × 16

RAM ARRAY

IO

0

–IO

7

ROW DECODER

A

8

A

7

A

6

A

5

A

2

COLUMN DECODER

A

11

A

12

A

13

A

14

A

15

SENSE AMPS

DATA IN DRIVERS

OE

A

4

A

3

IO

8

–IO

15

WE

BLE

BHE

A

16

A

0

A

1

A

17

A

9

A

18

A

10

CE

2

CE

1

A

19

Logic Block Diagram

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Summary

Page 2 - NC; Notes

CY62167EV18 MoBL ® Document #: 38-05447 Rev. *G Page 2 of 13 Pin Configuration Figure 1. 48-Ball VFBGA (6 x 7 x 1mm) / (6 x 8 x 1mm) Top View [1, 2, 3] Product Portfolio Product V CC Range (V) Speed (ns) Power Dissipation Operating I CC (mA) Standby I SB2 ( μ A) f = 1 MHz f = f max Min Typ [4] Max T...

Page 3 - Electrical Characteristics

CY62167EV18 MoBL ® Document #: 38-05447 Rev. *G Page 3 of 13 Maximum Ratings Exceeding the maximum ratings may impair the useful life of the device. These user guidelines are not tested.Storage Temperature ................................ –65°C to + 150°CAmbient Temperature with Power Applied .........

Page 4 - CE

CY62167EV18 MoBL ® Document #: 38-05447 Rev. *G Page 4 of 13 Thermal Resistance Tested initially and after any design or process changes that may affect these parameters. Parameter Description Test Conditions VFBGA (6 x 7 x 1mm) VFBGA (6 x 8 x 1mm) Unit Θ JA Thermal Resistance (Junction to Ambient) ...

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