Cypress CY62147EV30 - Manual

Cypress CY62147EV30

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Table of Contents:

  • Page 2 – ns; Notes
  • Page 3 – Electrical Characteristics
  • Page 4 – DATA RETENTION MODE; CE or
  • Page 5 – Switching Characteristics
  • Page 6 – Switching Waveforms; PREVIOUS DATA VALID; RC; ADDRESS
  • Page 7 – SA
  • Page 10 – Package Diagrams
  • Page 12 – Document History Page; Change
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CY62147EV30 MoBL

®

4-Mbit (256K x 16) Static RAM

Cypress Semiconductor Corporation

198 Champion Court

San Jose

,

CA 95134-1709

408-943-2600

Document #: 38-05440 Rev. *G

Revised March 31, 2009

Features

Very high speed: 45 ns

Temperature ranges

Industrial: –40°C to +85°C

Automotive-A: –40°C to +85°C

Automotive-E: –40°C to +125°C

Wide voltage range: 2.20V to 3.60V

Pin compatible with CY62147DV30

Ultra low standby power

Typical standby current: 1

μ

A

Maximum standby current: 7

μ

A (Industrial)

Ultra low active power

Typical active current: 2 mA at f = 1 MHz

Easy memory expansion with CE

[1]

and OE features

Automatic power down when deselected

CMOS for optimum speed and power

Available in Pb-free 48-ball VFBGA (single/dual CE option) and
44-pin TSOPII packages

Byte power down feature

Functional Description

The CY62147EV30 is a high performance CMOS static RAM
organized as 256K words by 16 bits. This device features
advanced circuit design to provide ultra low active current. It is

ideal for providing More Battery Life™ (MoBL

®

) in portable appli-

cations such as cellular telephones. The device also has an
automatic power down feature that significantly reduces power
consumption when addresses are not toggling. Placing the
device into standby mode reduces power consumption by more
than 99% when deselected (CE HIGH or both BLE and BHE are
HIGH). The input and output pins (IO

0

through IO

15

) are placed

in a high impedance state when:

Deselected (CE HIGH)

Outputs are disabled (OE HIGH)

Both Byte High Enable and Byte Low Enable are disabled
(BHE, BLE HIGH)

Write operation is active (CE LOW and WE LOW)

To write to the device, take Chip Enable (CE) and Write Enable
(WE) inputs LOW. If Byte Low Enable (BLE) is LOW, then data
from IO pins (IO

0

through IO

7

) is written into the location

specified on the address pins (A

0

through A

17

). If Byte High

Enable (BHE) is LOW, then data from IO pins (IO

8

through IO

15

)

is written into the location specified on the address pins (A

0

through A

17

).

To read from the device, take Chip Enable (CE)

and Output

Enable (OE) LOW while forcing the Write Enable (WE) HIGH. If
Byte Low Enable (BLE) is LOW, then data from the memory
location specified by the address pins appear on IO

0

to IO

7

. If

Byte High Enable (BHE) is LOW, then data from memory
appears on IO

8

to IO

15

. See the

Truth Table

on page 9 for a

complete description of read and write modes.

For best practice recommendations, refer to the Cypress
application note

AN1064, SRAM System Guidelines

.

256K x 16

RAM Array

IO

0

–IO

7

RO

W

DECODER

A

8

A

7

A

6

A

5

A

2

COLUMN DECODER

A

11

A

12

A

13

A

14

A

15

SENSE AMPS

DATA IN DRIVERS

OE

A

4

A

3

IO

8

–IO

15

CE

[1]

WE

BHE

A

16

A

0

A

1

A

9

A

10

BLE

A

17

BHE

BLE

CE

POWER DOWN

CIRCUIT

Logic Block Diagram

Note

1. BGA packaged device is offered in single CE and dual CE options. In this data sheet, for a dual CE device, CE

refers to the internal logical combination of CE

1

and

CE

2

such that when CE

1

is LOW and CE

2

is HIGH, CE is LOW. For all other cases CE is HIGH.

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Summary

Page 2 - ns; Notes

CY62147EV30 MoBL ® Document #: 38-05440 Rev. *G Page 2 of 13 Pin Configuration Figure 1. 48-Ball VFBGA (Single Chip Enable) [3, 4] Figure 2. 48-Ball VFBGA (Dual Chip Enable) [3, 4] Figure 3. 44-Pin TSOP II [3] Product Portfolio Product Range V CC Range (V) Speed (ns) Power Dissipation Operating I CC...

Page 3 - Electrical Characteristics

CY62147EV30 MoBL ® Document #: 38-05440 Rev. *G Page 3 of 13 Maximum Ratings Exceeding the maximum ratings may impair the useful life of thedevice. User guidelines are not tested. Storage Temperature ................................ –65°C to + 150°C Ambient Temperature withPower Applied ...............

Page 4 - DATA RETENTION MODE; CE or

CY62147EV30 MoBL ® Document #: 38-05440 Rev. *G Page 4 of 13 Thermal Resistance [9] Parameter Description Test Conditions VFBGA Package TSOP II Package Unit Θ JA Thermal Resistance (Junction to Ambient) Still Air, soldered on a 3 × 4.5 inch, two-layer printed circuit board 75 77 ° C/W Θ JC Thermal R...

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