Cypress CY62128B - Manual

Cypress CY62128B

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Table of Contents:

  • Page 2 – MoBL; Pin Configurations; Pin Definitions; CC; Top View; SOIC
  • Page 3 – Maximum Ratings; Electrical Characteristics
  • Page 4 – Thermal Resistance; Data Retention Waveform
  • Page 5 – Switching Characteristics; Parameter; Switching Waveforms; PREVIOUS DATA VALID; ADDRESS
  • Page 6 – or CE
  • Page 8 – Truth Table; Ordering Information
  • Page 9 – Package Diagrams
  • Page 10 – 2-Lead Reverse Thin Small Outline Package ZR32
  • Page 11 – Document History Page; Issue
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1-Mbit (128K x 8) Static RAM

CY62128B

MoBL

®

Cypress Semiconductor Corporation

3901 North First Street

San Jose

,

CA 95134

408-943-2600

Document #: 38-05300 Rev. *C

Revised March 7, 2005

Features

• Temperature Ranges

— Commercial: 0°C to 70°C

— Industrial: –40°C to 85°C

— Automotive: –40°C to 125°C

• 4.5V–5.5V operation
• CMOS for optimum speed/power
• Low active power

(70 ns, LL version, Commercial, Industrial)

— 82.5 mW (max.) (15 mA)

• Low standby power

(70 ns, LL version, Commercial, Industrial)

— 110

µ

W (max.) (15

µ

A)

• Automatic power-down when deselected
• TTL-compatible inputs and outputs
• Easy memory expansion with CE

1

, CE

2

, and OE options

Functional Description

[1]

The CY62128B is a high-performance CMOS static RAM
organized as 131,072 words by 8 bits. Easy memory
expansion is provided by an active LOW Chip Enable (CE

1

),

an active HIGH Chip Enable (CE

2

), an active LOW Output

Enable (OE), and three-state drivers. This device has an
automatic power-down feature that reduces power
consumption by more than 75% when deselected.

Writing to the device is accomplished by taking Chip Enable
One (CE

1

) and Write Enable (WE) inputs LOW and Chip

Enable Two (CE

2

) input HIGH. Data on the eight I/O pins (I/O

0

through I/O

7

) is then written into the location specified on the

address pins (A

0

through A

16

).

Reading from the device is accomplished by taking Chip
Enable One (CE

1

) and Output Enable (OE) LOW while forcing

Write Enable (WE) and Chip Enable Two (CE

2

) HIGH. Under

these conditions, the contents of the memory location
specified by the address pins will appear on the I/O pins.

The eight input/output pins (I/O

0

through I/O

7

) are placed in a

high-impedance state when the device is deselected (CE

1

HIGH or CE

2

LOW), the outputs are disabled (OE HIGH), or

during a write operation (CE

1

LOW, CE

2

HIGH, and WE LOW).

The CY62128B is available in a standard 450-mil-wide SOIC,
32-pin TSOP type I and STSOP packages.

Note:

1.

For best-practice recommendations, please refer to the Cypress application note “System Design Guidelines” on http://www.cypress.com.

14

15

Logic Block Diagram

A1
A2
A3

A4
A5

A6
A7

A8

COLUMN

DECODER

RO

W

D

E

CO

D

E

R

SE

NS

E AMP

S

INPUT BUFFER

POWER

DOWN

WE

OE

I/O 0

CE2

I/O 1

I/O 2

I/O 3

512x 256x 8

ARRAY

I/O 7

I/O 6

I/O 5

I/O 4

A0

A

11

A

13

A

12

A

A

10

CE1

A

A

16

A

9

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Summary

Page 2 - MoBL; Pin Configurations; Pin Definitions; CC; Top View; SOIC

CY62128B MoBL ® Document #: 38-05300 Rev. *C Page 2 of 11 Pin Configurations Product Portfolio Product V CC Range (V) Speed (ns) Power Dissipation Operating, I CC (mA) Standby, I SB2 ( µ A) Min. Typ. [2] Max. Typ. [2] Max. Typ. [2] Max. CY62128BLL Industrial 4.5 5.0 5.5 55 7.5 20 2.5 15 Industrial 7...

Page 3 - Maximum Ratings; Electrical Characteristics

CY62128B MoBL ® Document #: 38-05300 Rev. *C Page 3 of 11 Maximum Ratings (Above which the useful life may be impaired. For user guide-lines, not tested.) Storage Temperature ................................. –65 ° C to +150 ° C Ambient Temperature withPower Applied ....................................

Page 4 - Thermal Resistance; Data Retention Waveform

CY62128B MoBL ® Document #: 38-05300 Rev. *C Page 4 of 11 Thermal Resistance [6] Parameter Description Test Conditions 32 SOIC 32 TSOP 32 STSOP 32 RTSOP Unit Θ JA Thermal Resistance(Junction to Ambient) Test conditions follow standard test methods and procedures for measuring thermal impedance, per ...

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