Nikon LV150 - Manual

Nikon LV150

This user manual covers Nikon’s Eclipse LV series industrial microscopes–specifically the LV150, LV150A, and LV100D models–designed for precision applications like semiconductor inspection, materials analysis, and precision manufacturing. The document emphasizes their modular design, allowing customization with compatible stages, illumination systems (including diascopic and epi-fluorescence setups), and advanced optical components such as correction rings and UV-compatible lenses. Key features include enhanced durability, motorized nosepieces, and support for various observation techniques like brightfield, darkfield, and Nomarski DIC microscopy. Compatibility with accessories like digital cameras (e.g., DS-2Mv series) and stage adapters is also highlighted to ensure broad functionality across industrial workflows.

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Table of Contents:

  • Page 1 – Product Identification and Support Information
  • Page 2 – Modular Microscopy System Versatility
  • Page 3 – Microscope Modularity and Sample Accommodation
  • Page 4 – Optical Performance Enhancements
  • Page 5 – Microscope Observation Methods and Design
  • Page 6 – LV150/LV150A Episcopic Illumination Microscope
  • Page 7 – LV100D Microscope Components and Applications
  • Page 8 – Compatible Microscope Accessories
  • Page 9 – Digital Camera Integration
  • Page 10 – Dimensional Diagrams of Microscope Components
  • Page 11 – Main Specifications for Microscope Models
  • Page 12 – System Diagrams and Configuration
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Page 1

En

Specifications and equipment are subject to change without any notice or obligation
on the part of the manufacturer. April 2005.

©2000-05 NIKON CORPORATION

This brochure is printed on recycled paper made from 40% used material.

WARNING

TO ENSURE CORRECT USAGE, READ THE CORRESPONDING MANUALS

CAREFULLY BEFORE USING YOUR EQUIPMENT.

Printed in Japan (0504-05)T

Code No. 2CE-KWFH-7

www.nikon.com/

Fuji Bldg., 2-3, Marunouchi 3-chome, Chiyoda-ku,
Tokyo 100-8331, Japan

NIKON CORPORATION

NIKON INSTECH CO., LTD.

Parale Mitsui Bldg., 8, Higashida-cho, Kawasaki-ku,
Kawasaki, Kanagawa 210-0005, Japan
phone: +81-44-223-2175 fax: +81-44-223-2182

http://www.nikon-instruments.jp/eng/

NIKON INSTRUMENTS (SHANGHAI) CO., LTD.

CHINA phone: +86-21-5836-0050 fax: +86-21-5836-0030
(Beijing office)
CHINA phone: +86-10-5869-2255 fax: +86-10-5869-2277

NIKON SINGAPORE PTE LTD

SINGAPORE phone: +65-6559-3618 fax: +65-6559-3668

NIKON MALAYSIA SDN. BHD.

MALAYSIA phone: +60-3-78763887 fax: +60-3-78763387

NIKON INSTRUMENTS EUROPE B.V.

P.O. Box 222, 1170 AE Badhoevedorp, The Netherlands
phone: +31-20-44-96-222 fax: +31-20-44-96-298

http://www.nikon-instruments.com/

NIKON FRANCE S.A.S.

FRANCE phone: +33-1-45-16-45-16 fax: +33-1-45-16-00-33

NIKON GMBH

GERMANY phone: +49-211-9414-0 fax: +49-211-9414-322

NIKON INSTRUMENTS S.p.A.

ITALY phone: + 39-55-3009601 fax: + 39-55-300993

NIKON AG

SWITZERLAND phone: +41-43-277-2860 fax: +41-43-277-2861

NIKON UK LTD.

UNITED KINGDOM phone: +44-20-8541-4440 fax: +44-20-8541-

NIKON INSTRUMENTS INC.

1300 Walt Whitman Road, Melville, N.Y. 11747-3064, U.S.A.
phone: +1-631-547-8500; +1-800-52-NIKON (within the U.S.A.only) fax: +1-631-547-0306

http://www.nikonusa.com/

NIKON CANADA INC.

CANADA phone: +1-905-625-9910 fax: +1-905-625-0103

Industrial Microscopes LV150/150A/100D

Industrial Microscopes

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About this manual

Brand
Nikon
Model
LV150
Document type
Manual
Language(s)
English
Pages
12
File size
2.6 MB
Format
PDF

Summary

Page 1 - Product Identification and Support Information

Identification of Nikon Industrial Microscope models including Eclipse LV150, LV150A, and LV100D, contact information, and certification marks.

Page 2 - Modular Microscopy System Versatility

Showcase of the modular microscopy system's versatility and improved performance for examining MEMS, semiconductors, materials, PCBs, precision molds, FPDs, and display devices.

Page 3 - Microscope Modularity and Sample Accommodation

Details on the versatility of the Eclipse LV series microscopes, modular design, compatibility with stages, accommodating taller samples using column risers, and support for diascopic illumination.

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