Hitachi 4500 - Manual

Hitachi 4500

A user manual for Hitachi’s Model 4500-II scanning electron microscope (SEM) covers essential operational procedures, emphasizing safety and systematic workflows. The guide includes detailed instructions for preparing samples, adjusting magnification and voltage settings, handling specimen exchange, and troubleshooting common issues like detector alignment or focus adjustments. Safety protocols–such as avoiding forced controls and seeking assistance when needed–are central to its design, alongside procedures for proper shutdown and session logging.

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Table of Contents:

  • Page 1 – Microscope Start-up and Sample Insertion Safety
  • Page 2 – Scanning Electron Microscope Operation Procedures
  • Page 3 – SEM 4500 Imaging and Alignment
  • Page 4 – Detector and Working Distance Adjustment
  • Page 5 – Specimen Handling Procedures
  • Page 6 – Session Termination Protocol
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Page 1

HITACHI 4500-Il INSTRUCTIONS

The following instructions provide a guide to performing simple tasks on the microscope. Initial sections
(A to D) describe how to insert a sample and obtain an image. Subsequent sections provide information
on more COni~!CX operations such as changing the accelerating voltage or the detecton Sections K and
L provide infonnation on what to do at the end of a session.

Compared with the JEOL 840 SEM there are more variable parameters available to the operator.
Optimum imaging conditions will vary from user to user depending on their samples. It is
advisable that you spend some time attempting to determine which conditions are best for your
sample.


When using this microscope please note the following rules:

RULE 1: DON'T TOUCH A CONTROL IF YOU ARE NOT SURE OF THE

OUTCOME

OF

THAT

ACTION.

RULE 2: NEVER, EVER FORCE ANYTHING BEYOND FINGER STRENGTH

RULE 3: IF IN DOUBT; ASK FOR HELP


A. START-UP

1. Turn on the visual display by turning toggle switch

DISPLAY POWER

to 1. (These

toggle switches must be pulled out slightly before switching - DO NOT FORCE THEM)

2. Turn the toggle switch SC

AIRLOCK VALVE

from

CLOSED

to

AUTO

(OPEN)- a

few seconds later the green light on the HV off/ready display will come on. If it doesn't please
contact EM staff for help.


B. INSERT SAMPLE

1. Put specimen stub onto specimen holder> inc exact mechanism will vary depending upon
the specimen type. EM Unit staff will advise the best method for your sample when you art
being trained. The specimen holder and stub MUST be set so that so that thtt top of the
specimen is level with or below tIze gauge.
2. Ensure toggle switch on SC

AIRLOCK VALVE DISPLAY

is set to S.E.C.

3. Press

AIR

on

Sc AIRLOCK VALVE DISPLAY -

this will bleed air into the specimen

exchange chamber. It will take 2~3O seconds for the chamber to come to air.

4. Ensure stage settings

(X,Y,Z,R

and T) have been return to their default positions

(displayed on the specimen chamber).
5. Open specimen exchange chamber door Do not force.
6. Push specimen exchange rod forward slightly so it protrudes through the specimen exchange
chamber door and screw specimen holder on to screw thread of the specimen exchange rod.

PLEASE MAKE SURE YOU DO NOT GET

A

CROSS THREAD.

Pull specimen

exchange rod back into specimen exchange chamber door.

7. Close airlock door

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About this manual

Brand
Hitachi
Model
4500
Document type
Manual
Language(s)
English
Pages
6
File size
37.7 KB
Format
PDF

Summary

Page 1 - Microscope Start-up and Sample Insertion Safety

Operational guidelines, safety rules, and step-by-step procedures for starting the microscope and preparing the specimen chamber.

Page 2 - Scanning Electron Microscope Operation Procedures

Instructions for operating a scanning electron microscope, including evacuation of the specimen exchange chamber, sample insertion/removal, beam activation, and setting voltage, magnification, focus, and positioning.

Page 3 - SEM 4500 Imaging and Alignment

Procedures for taking photographs, adjusting accelerating voltage, aligning the column, and troubleshooting methods for operational issues.

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