Dell JSM-6060LV- Manuals

Dell JSM-6060LV– User Manual, Manual in PDF format online.

Manuals:

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Summary

Page 2 - No part of the sample should extend above the ruler end

7. Slide sample holder onto stage dovetail. Note proper direction to slide on “dovetail” relative to step on stage platform. 8. Adjust sample height (Working Distance) using height gauge. 10 mm is the EDS working distance. Bottom end of ruler corresponds to the working distance (see photo). Adjust t...

Page 3 - The IR; EVAC

9. Specimen tilting is limited by working distance and specimen diameter. The IR chamber-scope must be used for sample tilting and Z adjustment to verify that safe clearance with detectors, etc. is maintained. Safe clearance is at least 5mm distance on LCD monitor. The following table shows the typi...

Page 4 - Recommended Procedure:

15. Set the Signal to SEI , if not already (You can change it to BEIW , if desired later). 16. Click the HT Ready icon to turn on the High Voltage, now should be Some intensity should be seen in the image window. If not press View and ACB . ACB takes several seconds to run. Something should be visib...

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Summary

Page 2 - Table of Contents

J E O L J S M - 6 0 6 0 L V S C A N N I N G E L E C T R O N M I C R O S C O P E 1 Table of Contents 1 I N T R O D U C T I O N Safety 3 2 B A C K G R O U N D Background Information 4 References 4 3 S A M P L E S Sample Holders 7 Sample Preparation 7 4 O P E R A T I O N Instrument Startup 8 Sample Loa...

Page 3 - Introduction; Safety

J E O L J S M - 6 0 6 0 L V S C A N N I N G E L E C T R O N M I C R O S C O P E 2 Introduction he JEOL JSM-6060LV is a state-of-the-art scanning electron microscope that features a low vacuum for observation of non-conductive specimens, a fully automated electron gun, a backscattered electron detect...

Page 4 - Background

J E O L J S M - 6 0 6 0 L V S C A N N I N G E L E C T R O N M I C R O S C O P E 3 Background The scanning electron microscope (SEM) is one of the most versatile instruments for the examination and analysis of the microstructural characteristics of solids. Although the SEM and optical microscope shar...

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