Nikon L200A - Manual
Nikon L200A – Manual, read for free online in PDF format. We hope this helps you resolve any issues you may have. If you have further questions, please contact us through the contact form.
Table of Contents:
- Page 2 – Standardized, contamination-free inspections; Remote Controller
- Page 3 – Easy configuration into an automated inspection system; Programmed settings; Communication System Diagram
- Page 4 – High-contrast darkfield images; CFI LU/L Plan series objectives; Vibration-isolation design; System Diagram
- Page 5 – Specifications
Automated IC Inspection Microscope
Automated IC Inspection Microscope L200A
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Summary
The next generation in automated IC inspection microscopy The Eclipse L200A has scored majoradvances in the standardization ofinspection and safeguards againstcontamination. In a new design thatcombines motorized control withautomated operation, observationconditions can be programmed foreach indivi...
Easy configuration into an automated inspection system Programmed settings As an inspection process varies depending on substrate,layer, and even the operator, it has been necessary to re-adjust settings for each inspection process.The L200A's programming feature eliminates this process.You just sel...
Top-notch basic performance facilitates inspections Accessories to enhance performance High-contrast darkfield images A new illuminationsystem produces aSignal to Background(S/B) ratio that isnearly three timesgreater than formermodels. Thisimproves sensitivityduring darkfieldobservations, enabling ...
