Nikon L200A - Manuals

The next generation in automated IC inspection microscopy The Eclipse L200A has scored majoradvances in the standardization ofinspection and safeguards againstcontamination. In a new design thatcombines motorized control withautomated operation, observationconditions can be programmed foreach indivi...

Easy configuration into an automated inspection system Programmed settings As an inspection process varies depending on substrate,layer, and even the operator, it has been necessary to re-adjust settings for each inspection process.The L200A's programming feature eliminates this process.You just sel...

Top-notch basic performance facilitates inspections Accessories to enhance performance High-contrast darkfield images A new illuminationsystem produces aSignal to Background(S/B) ratio that isnearly three timesgreater than formermodels. Thisimproves sensitivityduring darkfieldobservations, enabling ...